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公开(公告)号:CN102222633B
公开(公告)日:2014-07-09
申请号:CN201110096944.X
申请日:2011-04-15
Applicant: 日东电工株式会社
CPC classification number: H01L24/83 , B23K26/364 , B23K26/40 , B23K2103/50 , B28D5/0011 , H01L21/6836 , H01L24/27 , H01L24/29 , H01L24/45 , H01L24/48 , H01L24/73 , H01L2221/68336 , H01L2221/68359 , H01L2224/27436 , H01L2224/29 , H01L2224/2919 , H01L2224/2929 , H01L2224/29386 , H01L2224/32225 , H01L2224/32245 , H01L2224/45124 , H01L2224/45144 , H01L2224/45147 , H01L2224/48091 , H01L2224/48227 , H01L2224/48247 , H01L2224/73265 , H01L2224/83191 , H01L2224/83855 , H01L2224/85207 , H01L2224/92247 , H01L2924/00013 , H01L2924/01005 , H01L2924/01006 , H01L2924/01011 , H01L2924/01012 , H01L2924/01013 , H01L2924/01014 , H01L2924/01015 , H01L2924/01016 , H01L2924/01019 , H01L2924/0102 , H01L2924/01028 , H01L2924/01029 , H01L2924/01033 , H01L2924/01047 , H01L2924/01051 , H01L2924/01052 , H01L2924/01057 , H01L2924/01058 , H01L2924/0106 , H01L2924/01072 , H01L2924/01079 , H01L2924/01082 , H01L2924/0665 , H01L2924/10253 , H01L2924/15747 , H01L2924/15788 , H01L2924/181 , H01L2924/20103 , H01L2924/20104 , H01L2924/20105 , H01L2924/20106 , H01L2924/3025 , Y10T428/28 , H01L2924/00014 , H01L2924/00 , H01L2924/3512 , H01L2924/00012 , H01L2924/0532 , H01L2924/05432 , H01L2924/05032 , H01L2924/0503 , H01L2224/29099 , H01L2224/29199 , H01L2224/29299
Abstract: 本发明提供通过拉伸张力芯片接合薄膜恰当地断裂的热固型芯片接合薄膜。一种热固型芯片接合薄膜,用于以下方法:对半导体晶片照射激光形成改性区域后,通过用改性区域将半导体晶片断裂而由半导体晶片得到半导体元件的方法;或者在半导体晶片的表面形成未到达背面的沟后,进行半导体晶片的背面磨削,通过从背面露出沟而由半导体晶片得到半导体元件的方法,所述热固型芯片接合薄膜的特征在于,热固化前25℃下的断裂伸长率大于40%且不超过500%。本发明还提供切割/芯片接合薄膜及半导体装置的制造方法。
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公开(公告)号:CN101445709B
公开(公告)日:2011-09-28
申请号:CN200810178919.4
申请日:2008-11-27
Applicant: 第一毛织株式会社
IPC: C09J11/00 , C09J133/00 , C09J175/00 , C09J163/00 , C09J7/00
CPC classification number: H01L24/27 , C08L2666/14 , C09J7/20 , C09J133/062 , C09J163/00 , C09J2203/326 , C09J2433/00 , C09J2461/00 , C09J2463/00 , H01L21/6836 , H01L24/29 , H01L24/83 , H01L2221/68327 , H01L2224/274 , H01L2224/29 , H01L2224/2919 , H01L2224/2929 , H01L2224/29339 , H01L2224/29347 , H01L2224/29355 , H01L2224/29386 , H01L2224/29387 , H01L2224/29388 , H01L2224/29393 , H01L2224/83191 , H01L2224/8385 , H01L2924/00013 , H01L2924/01005 , H01L2924/01006 , H01L2924/01012 , H01L2924/01013 , H01L2924/01015 , H01L2924/01019 , H01L2924/0102 , H01L2924/01021 , H01L2924/01027 , H01L2924/01029 , H01L2924/01033 , H01L2924/01045 , H01L2924/01047 , H01L2924/01072 , H01L2924/01073 , H01L2924/01075 , H01L2924/01078 , H01L2924/01079 , H01L2924/01082 , H01L2924/01322 , H01L2924/0665 , H01L2924/07802 , H01L2924/09701 , H01L2924/1461 , H01L2924/181 , Y10T428/2848 , H01L2924/0635 , H01L2924/066 , H01L2924/00 , H01L2924/3512 , H01L2924/00014 , H01L2924/05432 , H01L2924/0532 , H01L2924/05032 , H01L2924/05442 , H01L2924/0503 , H01L2224/29099 , H01L2224/29199 , H01L2224/29299
Abstract: 本发明提供一种半导体组装芯片粘接用粘合剂组合物,以及采用该组合物制得的粘合膜,所述组合物包括一种双组分溶剂,其包括沸点为0~100℃的低沸点溶剂和另一种沸点为140~200℃的高沸点溶剂。本发明的溶剂残留量小于2%的粘合膜可在提高固化组分含量时同时满足膜的延展性结构和增强的抗张强度,从而在防止膜被切割的同时提高了硬度。由于产生间隙的挥发性组分具有高沸点,则半导体组装中由溶剂挥发而产生的间隙可得到显著降低。其结果是所述粘合膜显示出在粘合膜表面产生的间隙或空隙的体积膨胀降低,从而保证极好的膜可靠性。
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公开(公告)号:CN102190975A
公开(公告)日:2011-09-21
申请号:CN201110051582.2
申请日:2011-03-01
Applicant: 日东电工株式会社
CPC classification number: H01L24/27 , C09J7/10 , C09J2203/326 , C09J2433/00 , C09J2461/00 , C09J2463/00 , H01L21/6836 , H01L23/3121 , H01L24/29 , H01L24/32 , H01L24/45 , H01L24/48 , H01L24/73 , H01L24/83 , H01L25/0657 , H01L2224/27436 , H01L2224/29 , H01L2224/29101 , H01L2224/2919 , H01L2224/2929 , H01L2224/29386 , H01L2224/32145 , H01L2224/32225 , H01L2224/32245 , H01L2224/45124 , H01L2224/45144 , H01L2224/45147 , H01L2224/48091 , H01L2224/48227 , H01L2224/48247 , H01L2224/73215 , H01L2224/73265 , H01L2224/83191 , H01L2224/85206 , H01L2224/85207 , H01L2224/92247 , H01L2225/0651 , H01L2225/06568 , H01L2924/00013 , H01L2924/01005 , H01L2924/01006 , H01L2924/01012 , H01L2924/01013 , H01L2924/01014 , H01L2924/01015 , H01L2924/01019 , H01L2924/0102 , H01L2924/01023 , H01L2924/01028 , H01L2924/01029 , H01L2924/0103 , H01L2924/01033 , H01L2924/01051 , H01L2924/01057 , H01L2924/01074 , H01L2924/01079 , H01L2924/01082 , H01L2924/014 , H01L2924/0665 , H01L2924/10253 , H01L2924/181 , H01L2924/20103 , H01L2924/20104 , H01L2924/20105 , H01L2924/20106 , H01L2924/3025 , Y10T428/24959 , Y10T428/28 , Y10T428/2848 , Y10T428/287 , H01L2924/00014 , H01L2924/00 , H01L2924/3512 , H01L2924/00012 , H01L2924/05442 , H01L2924/0532 , H01L2924/05432 , H01L2924/05032 , H01L2924/0503 , H01L2224/29099 , H01L2224/29199 , H01L2224/29299
Abstract: 本发明提供用于在通过焊线与被粘物电连接的半导体元件上胶粘另一个半导体元件的芯片接合薄膜,其可以防止所述焊线的变形或断裂,可以搭载另一个半导体元件,由此可以提高半导体装置的制造成品率,本发明还提供切割/芯片接合薄膜。本发明芯片接合薄膜,用于在通过焊线与被粘物电连接的半导体元件上胶粘另一个半导体元件,其中,至少由第一胶粘剂层和第二胶粘剂层层叠而形成,所述第一胶粘剂层在压接时可以将所述焊线的一部分埋没而使其通过所述第一胶粘剂层的内部,所述第二胶粘剂层用于防止所述另一个半导体元件与焊线接触。
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公开(公告)号:CN101661909B
公开(公告)日:2011-04-27
申请号:CN200910165975.9
申请日:2009-08-20
Applicant: 日东电工株式会社
IPC: H01L23/00 , C09J133/04
CPC classification number: H01L21/6836 , C08G59/621 , C08L33/06 , C08L2666/04 , C09J163/00 , H01L24/27 , H01L24/29 , H01L24/32 , H01L24/45 , H01L24/48 , H01L24/73 , H01L24/83 , H01L24/85 , H01L25/0657 , H01L2221/68327 , H01L2224/274 , H01L2224/29 , H01L2224/29084 , H01L2224/29101 , H01L2224/2919 , H01L2224/2929 , H01L2224/29386 , H01L2224/32145 , H01L2224/32225 , H01L2224/45124 , H01L2224/45144 , H01L2224/45147 , H01L2224/48091 , H01L2224/48227 , H01L2224/73265 , H01L2224/83191 , H01L2224/83855 , H01L2224/85001 , H01L2224/85205 , H01L2224/92247 , H01L2924/00013 , H01L2924/00014 , H01L2924/01005 , H01L2924/01006 , H01L2924/01007 , H01L2924/01012 , H01L2924/01013 , H01L2924/01014 , H01L2924/01015 , H01L2924/01016 , H01L2924/01019 , H01L2924/0102 , H01L2924/01027 , H01L2924/01029 , H01L2924/01032 , H01L2924/01033 , H01L2924/01045 , H01L2924/01051 , H01L2924/01057 , H01L2924/01075 , H01L2924/01077 , H01L2924/01079 , H01L2924/01082 , H01L2924/014 , H01L2924/04953 , H01L2924/0665 , H01L2924/07802 , H01L2924/10253 , H01L2924/15788 , H01L2924/181 , H01L2924/20103 , H01L2924/20104 , H01L2924/20105 , H01L2924/20106 , H01L2924/3025 , Y10T428/31511 , H01L2924/0635 , H01L2924/066 , H01L2224/78 , H01L2924/00 , H01L2924/00012 , H01L2924/3512 , H01L2924/05442 , H01L2924/0532 , H01L2924/05432 , H01L2924/05032 , H01L2924/0503 , H01L2224/29099 , H01L2224/29199 , H01L2224/29299
Abstract: 本发明提供在将半导体元件芯片接合到被粘物上时,抑制其边缘部产生微孔或局部收缩,结果能够提高半导体装置的制造成品率的热固化型芯片接合薄膜。本发明的热固化型芯片接合薄膜,是制造半导体装置时使用的热固化型接合膜,其中,至少包含环氧树脂、酚树脂及丙烯酸系共聚物,并且当设所述环氧树脂与酚树脂的总重量为X、丙烯酸系共聚物的重量为Y时,其比率X/Y为0.7~5。
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公开(公告)号:CN105210157B
公开(公告)日:2017-05-31
申请号:CN201480021985.4
申请日:2014-09-12
Applicant: 积水化学工业株式会社
CPC classification number: H01R13/03 , H01B1/22 , H01L24/05 , H01L24/29 , H01L24/32 , H01L24/83 , H01L2224/04026 , H01L2224/05611 , H01L2224/05624 , H01L2224/05639 , H01L2224/05644 , H01L2224/05647 , H01L2224/05655 , H01L2224/0568 , H01L2224/05684 , H01L2224/2732 , H01L2224/29082 , H01L2224/2919 , H01L2224/2929 , H01L2224/29294 , H01L2224/29338 , H01L2224/29339 , H01L2224/29344 , H01L2224/29347 , H01L2224/29355 , H01L2224/29366 , H01L2224/29386 , H01L2224/29387 , H01L2224/2939 , H01L2224/29393 , H01L2224/29401 , H01L2224/29409 , H01L2224/29411 , H01L2224/29413 , H01L2224/29416 , H01L2224/29417 , H01L2224/29418 , H01L2224/2942 , H01L2224/29424 , H01L2224/29439 , H01L2224/29444 , H01L2224/29447 , H01L2224/29455 , H01L2224/29457 , H01L2224/29464 , H01L2224/29466 , H01L2224/29469 , H01L2224/29471 , H01L2224/29486 , H01L2224/29487 , H01L2224/2949 , H01L2224/29493 , H01L2224/29499 , H01L2224/32227 , H01L2224/83101 , H01L2224/83203 , H01L2224/83411 , H01L2224/83424 , H01L2224/83444 , H01L2224/83447 , H01L2224/83455 , H01L2224/8348 , H01L2224/83484 , H01L2224/83851 , H01L2224/83855 , H01L2224/83862 , H01L2224/83877 , H01L2924/15788 , H01R4/04 , H05K3/323 , H05K3/361 , H05K2201/0218 , H05K2201/0221 , H01L2924/00 , H01L2924/00014 , H01L2924/05442 , H01L2924/05432 , H01L2924/05342 , H01L2924/0549 , H01L2924/0532 , H01L2924/01056 , H01L2924/0534 , H01L2924/01022 , H01L2924/01006 , H01L2924/01014 , H01L2924/01032 , H01L2924/01048 , H01L2924/0543 , H01L2924/01049 , H01L2924/0544 , H01L2924/0105 , H01L2924/01015 , H01L2924/01005 , H01L2924/0781 , H01L2924/04563 , H01L2924/01082 , H01L2924/01047 , H01L2924/01029 , H01L2924/00012
Abstract: 本发明提供一种导电性粒子,其对电极间进行电连接的情况下,可以降低连接电阻。本发明的导电性粒子1具备:基材粒子2、配置于基材粒子2表面上的导电部3,导电部3在外表面上具有多个突起3a,导电部3具有晶体结构,在导电部3的具有突起3a的部分和不具有突起3a的部分,晶体结构是连续的。
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公开(公告)号:CN104733329A
公开(公告)日:2015-06-24
申请号:CN201410068916.0
申请日:2014-02-27
Applicant: 台湾积体电路制造股份有限公司
IPC: H01L21/56 , H01L21/50 , H01L23/373 , H01L25/00 , H01L25/16
CPC classification number: H01L21/76251 , H01L21/4871 , H01L21/4882 , H01L21/563 , H01L21/6836 , H01L23/04 , H01L23/16 , H01L23/34 , H01L23/36 , H01L23/3675 , H01L23/3737 , H01L23/40 , H01L23/4012 , H01L23/42 , H01L24/13 , H01L24/16 , H01L24/17 , H01L24/27 , H01L24/29 , H01L24/32 , H01L24/33 , H01L24/73 , H01L24/83 , H01L24/92 , H01L24/97 , H01L25/0655 , H01L25/0657 , H01L2221/68327 , H01L2224/131 , H01L2224/16145 , H01L2224/16146 , H01L2224/16225 , H01L2224/16235 , H01L2224/17181 , H01L2224/26175 , H01L2224/27312 , H01L2224/27334 , H01L2224/29109 , H01L2224/29124 , H01L2224/29139 , H01L2224/29147 , H01L2224/29155 , H01L2224/29191 , H01L2224/2929 , H01L2224/29291 , H01L2224/29324 , H01L2224/29339 , H01L2224/29355 , H01L2224/29387 , H01L2224/32145 , H01L2224/32225 , H01L2224/32237 , H01L2224/32245 , H01L2224/32257 , H01L2224/33181 , H01L2224/73204 , H01L2224/73253 , H01L2224/81 , H01L2224/83104 , H01L2224/8321 , H01L2224/83424 , H01L2224/83447 , H01L2224/83493 , H01L2224/83862 , H01L2224/92122 , H01L2224/92125 , H01L2224/97 , H01L2924/01004 , H01L2924/0103 , H01L2924/05032 , H01L2924/0532 , H01L2924/0542 , H01L2924/05432 , H01L2924/15311 , H01L2924/1616 , H01L2924/16195 , H01L2924/1631 , H01L2924/16315 , H01L2924/014 , H01L2924/0715 , H01L2924/00014 , H01L2924/0665 , H01L2924/05442 , H01L2924/01006 , H01L2224/83 , H01L25/50 , H01L2924/00
Abstract: 本发明提供了一种用于封装半导体器件的方法和结构。在实施例中,将第一衬底接合至第二衬底,将第二衬底接合至第三衬底。在应用底部填充材料之前将热界面材料放置在第二衬底上。可以将环形件放置在热界面材料上,以及在第二衬底和第三衬底之间分配底部填充材料。通过在放置底部填充材料之前放置热界面材料和环形件,使得底部填充材料不能干扰热界面材料和第二衬底之间的界面,并且热界面材料和环形件可以用作底部填充材料的物理屏障,从而防止溢流。本发明还包括半导体封装结构和工艺。
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公开(公告)号:CN102952502A
公开(公告)日:2013-03-06
申请号:CN201210286852.2
申请日:2012-08-13
Applicant: 第一毛织株式会社
IPC: C09J133/00 , C09J163/00 , C09J7/00 , H01L23/29
CPC classification number: C09J9/00 , C08G59/50 , C08G59/621 , C08G59/688 , C08L33/00 , C09J163/00 , H01L23/293 , H01L24/29 , H01L24/32 , H01L25/0657 , H01L2224/2929 , H01L2224/29298 , H01L2224/29339 , H01L2224/29344 , H01L2224/29347 , H01L2224/29355 , H01L2224/29386 , H01L2224/29387 , H01L2224/29388 , H01L2224/32145 , H01L2224/32225 , H01L2224/83191 , H01L2224/92247 , H01L2924/01012 , H01L2924/01029 , H01L2924/181 , H01L2924/3512 , H01L2924/00 , H01L2924/0665 , H01L2924/00014 , H01L2924/05432 , H01L2924/0532 , H01L2924/05032 , H01L2924/05042 , H01L2924/0503
Abstract: 本发明涉及用于半导体的粘合剂组合物和包括该组合物的粘合剂膜和半导体装置。更具体地,本发明涉及具有两个分立的固化带使得低温固化和高温固化分别进行的用于半导体的粘合剂组合物,从而使半固化和成型后固化(PMC)能够去除或减少,具体地,在去除半固化工艺的情况下,能够使1次循环后使孔隙的比率能够减少到15%或更少。
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公开(公告)号:CN102598235A
公开(公告)日:2012-07-18
申请号:CN201080041801.2
申请日:2010-03-18
Applicant: 积水化学工业株式会社
IPC: H01L21/60 , C09J7/00 , C09J11/04 , C09J163/00 , H01L21/52
CPC classification number: C09J163/00 , C08G59/4014 , C08G59/686 , C08K3/36 , C09J7/35 , C09J2203/326 , C09J2205/102 , H01L23/295 , H01L24/29 , H01L2224/29101 , H01L2224/2919 , H01L2224/2929 , H01L2224/293 , H01L2224/29323 , H01L2224/29324 , H01L2224/29366 , H01L2224/2937 , H01L2224/29386 , H01L2924/00013 , H01L2924/01004 , H01L2924/01005 , H01L2924/01006 , H01L2924/01012 , H01L2924/01013 , H01L2924/0102 , H01L2924/01027 , H01L2924/01029 , H01L2924/0103 , H01L2924/01033 , H01L2924/0104 , H01L2924/01045 , H01L2924/01047 , H01L2924/0105 , H01L2924/01079 , H01L2924/01082 , H01L2924/014 , H01L2924/0665 , H01L2924/12042 , H01L2924/351 , H01L2924/00 , H01L2924/00014 , H01L2924/05442 , H01L2924/05432 , H01L2924/05032 , H01L2924/0503 , H01L2924/05042 , H01L2924/04642 , H01L2924/0532 , H01L2924/0542 , H01L2224/29099 , H01L2224/29199 , H01L2224/29299
Abstract: 本发明提供一种透明性高且容易识别半导体芯片焊接时的图案或位置显示的半导体接合用粘接剂。本发明为一种半导体接合用粘接剂,含有环氧树脂、无机填料及固化剂,其中,所述无机填料含有半导体接合用粘接剂中的含量为30~70重量%,且含有平均粒径低于0.1μm的填料A和平均粒径为0.1μm以上且低于1μm的填料B,所述填料A相对于所述填料B的重量比为1/9~6/4。另外,本发明为一种半导体接合用粘接剂,含有环氧树脂、无机填料、固化剂,其中,所述环氧树脂和所述无机填料的折射率之差为0.1以下。
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公开(公告)号:CN102108276A
公开(公告)日:2011-06-29
申请号:CN201010623310.0
申请日:2010-12-27
Applicant: 第一毛织株式会社
IPC: C09J163/00 , C09J163/04 , C09J133/00 , C09J11/06 , C09J7/00 , H01L21/68
CPC classification number: H01L24/29 , C08G59/621 , C08L21/00 , C09J163/00 , H01L2224/29 , H01L2224/2919 , H01L2224/2929 , H01L2224/29339 , H01L2224/29344 , H01L2224/29347 , H01L2224/29355 , H01L2224/29386 , H01L2224/29387 , H01L2224/29388 , H01L2224/29393 , H01L2924/00013 , H01L2924/01005 , H01L2924/01006 , H01L2924/01012 , H01L2924/01013 , H01L2924/01019 , H01L2924/0102 , H01L2924/01021 , H01L2924/01023 , H01L2924/01029 , H01L2924/01033 , H01L2924/0104 , H01L2924/01045 , H01L2924/01047 , H01L2924/01051 , H01L2924/01072 , H01L2924/01078 , H01L2924/01079 , H01L2924/01082 , H01L2924/01322 , H01L2924/0665 , H01L2924/09701 , H01L2924/12044 , H01L2924/00 , H01L2924/3512 , H01L2924/00014 , H01L2924/05432 , H01L2924/0532 , H01L2924/05032 , H01L2924/05442 , H01L2924/0503 , H01L2224/29099 , H01L2224/29199 , H01L2224/29299
Abstract: 一种用于半导体器件的粘合剂组合物,包括弹性体树脂、环氧树脂、可固化酚醛树脂、固化促进剂、硅烷偶联剂和填料。所述硅烷偶联剂包括含环氧基的硅烷偶联剂和含过渡金属清除官能团的硅烷偶联剂。所述粘合剂组合物防止因过渡金属和过渡金属离子迁移引起的半导体芯片可靠性降低,因此在半导体封装期间或之后能最大程度提高半导体器件的运行效率。此外,所述粘合剂组合物为粘性膜提供软化的结构和高抗张强度,因此防止膜被不希望地切割,同时确保粘性膜的高可靠性和硬度。
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公开(公告)号:CN101857778A
公开(公告)日:2010-10-13
申请号:CN201010162346.3
申请日:2010-04-08
Applicant: 日东电工株式会社
IPC: C09J7/00 , C09J7/02 , C09J171/10 , H01L21/68 , H01L21/78
CPC classification number: H01L21/78 , C08L33/12 , C08L61/00 , C08L63/00 , C08L2203/162 , C08L2205/03 , H01L24/29 , H01L24/33 , H01L24/45 , H01L24/73 , H01L2224/29 , H01L2224/29101 , H01L2224/2919 , H01L2224/2929 , H01L2224/29311 , H01L2224/29316 , H01L2224/29318 , H01L2224/29324 , H01L2224/29339 , H01L2224/29344 , H01L2224/29347 , H01L2224/29355 , H01L2224/29364 , H01L2224/29371 , H01L2224/29386 , H01L2224/29393 , H01L2224/32145 , H01L2224/32225 , H01L2224/32245 , H01L2224/45015 , H01L2224/45124 , H01L2224/45144 , H01L2224/45147 , H01L2224/48091 , H01L2224/48225 , H01L2224/48227 , H01L2224/48247 , H01L2224/73265 , H01L2225/06565 , H01L2225/06568 , H01L2924/00013 , H01L2924/01005 , H01L2924/01006 , H01L2924/01013 , H01L2924/01015 , H01L2924/01019 , H01L2924/0102 , H01L2924/01023 , H01L2924/01024 , H01L2924/01029 , H01L2924/0103 , H01L2924/01033 , H01L2924/01045 , H01L2924/01047 , H01L2924/0105 , H01L2924/01051 , H01L2924/01056 , H01L2924/01074 , H01L2924/01079 , H01L2924/01082 , H01L2924/014 , H01L2924/0665 , H01L2924/10253 , H01L2924/15747 , H01L2924/15788 , H01L2924/181 , H01L2924/3025 , Y10T428/2874 , C08L2666/04 , H01L2924/00014 , H01L2924/00 , H01L2924/3512 , H01L2924/00012 , H01L2924/05442 , H01L2924/05432 , H01L2924/0532 , H01L2924/04642 , H01L2924/05042 , H01L2224/29099 , H01L2224/29199 , H01L2224/29299
Abstract: 本发明提供在半导体芯片的接合时可以大幅缩短作业时间的热固型芯片接合薄膜及该热固型芯片接合薄膜与切割薄膜层叠而形成的切割芯片接合薄膜。本发明的热固型芯片接合薄膜,是半导体装置制造时使用的热固型芯片接合薄膜,其特征在于,相对于该薄膜中的有机成分100重量份含量在0.2~1重量份范围内的热固化催化剂,是以非结晶状态含有的热固化催化剂。
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