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公开(公告)号：CN1295783C
公开(公告)日：2007-01-17
申请号：CN03120151.2
申请日：2003-03-10
Applicant: 株式会社日立制作所
IPC: H01L23/488 , H01L21/60
CPC classification number: H05K3/3484 , B23K35/0244 , B23K35/262 , H01L24/73 , H01L2224/05568 , H01L2224/05573 , H01L2224/1134 , H01L2224/13144 , H01L2224/13147 , H01L2224/16 , H01L2224/16235 , H01L2224/32225 , H01L2224/32245 , H01L2224/45124 , H01L2224/45144 , H01L2224/48091 , H01L2224/48227 , H01L2224/48247 , H01L2224/48472 , H01L2224/49171 , H01L2224/73204 , H01L2224/73265 , H01L2924/00013 , H01L2924/01012 , H01L2924/01046 , H01L2924/01078 , H01L2924/01079 , H01L2924/01087 , H01L2924/01322 , H01L2924/01327 , H01L2924/09701 , H01L2924/10253 , H01L2924/13091 , H01L2924/14 , H01L2924/15153 , H01L2924/1517 , H01L2924/15311 , H01L2924/16152 , H01L2924/181 , H01L2924/19041 , H01L2924/19105 , H05K1/141 , H05K3/3463 , H05K2201/0215 , H05K2201/0218 , H05K2201/045 , H05K2201/10636 , Y02P70/611 , H01L2924/00014 , H01L2224/13099 , H01L2924/00 , H01L2924/00012 , H01L2224/05639 , H01L2224/05644 , H01L2224/05655 , H01L2224/05669
Abstract: 在一种在温度层级结合中实现高温端焊接结合的电子装置中，半导体装置与衬底之间的结合部分通过由Cu之类构成的金属球和由金属球和Sn构成的化合物而形成，并且金属球通过化合物而结合在一起。
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公开(公告)号：CN1282286A
公开(公告)日：2001-01-31
申请号：CN98812250.2
申请日：1998-12-09
Applicant: 株式会社日立制作所
CPC classification number: H05K1/181 , B23K1/0016 , B23K35/004 , B23K35/007 , B23K35/262 , B23K2101/40 , H01L23/488 , H01L23/49811 , H01L23/532 , H01L24/29 , H01L2224/83101 , H01L2924/01322 , H01L2924/15747 , H05K3/3426 , H05K3/3463 , H05K2201/10909 , Y02P70/613 , Y10T29/49144 , Y10T29/49149 , Y10T29/49169 , Y10T428/12708 , Y10T428/12715 , H01L2924/00
Abstract: 一种无Pb焊料连接结构和电子装置,该无Pb焊料连接结构具有足够高的连接强度,获得即使在随时间的推移的情况下仍保持稳定的界面,保持足够的浸润性和对纤维状结晶的抵抗性。特别是,无Pb焊料的特征在于:作为代表性的无Pb焊料的Sn－Ag－Bi与电极连接,该电极的表面上形成有Sn－Bi层。最好,按照重量百分比计,上述Sn－Bi层中的Bi浓度在1—20%的范围内,以便获得足够高的浸润性。当要求更加可靠的接缝时,在上述Sn－Bi层的下面形成Cu层,以便获得具有足够高的界面强度的连接部。
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公开(公告)号：CN100578778C
公开(公告)日：2010-01-06
申请号：CN200610095821.3
申请日：2001-12-19
Applicant: 株式会社日立制作所
CPC classification number: H01L24/01 , B23K3/063 , B23K2101/40 , H01L24/27 , H01L24/29 , H01L24/33 , H01L24/73 , H01L24/75 , H01L24/83 , H01L2224/0401 , H01L2224/04026 , H01L2224/16225 , H01L2224/29 , H01L2224/29076 , H01L2224/29101 , H01L2224/29109 , H01L2224/29111 , H01L2224/2919 , H01L2224/292 , H01L2224/29211 , H01L2224/29311 , H01L2224/29347 , H01L2224/29499 , H01L2224/32225 , H01L2224/32245 , H01L2224/45124 , H01L2224/45144 , H01L2224/48091 , H01L2224/48227 , H01L2224/48247 , H01L2224/49171 , H01L2224/73265 , H01L2224/83101 , H01L2224/8319 , H01L2224/83801 , H01L2924/00011 , H01L2924/00013 , H01L2924/01004 , H01L2924/01005 , H01L2924/01006 , H01L2924/01012 , H01L2924/01013 , H01L2924/01014 , H01L2924/01019 , H01L2924/01024 , H01L2924/01027 , H01L2924/01028 , H01L2924/01029 , H01L2924/0103 , H01L2924/01032 , H01L2924/01033 , H01L2924/01039 , H01L2924/01042 , H01L2924/01046 , H01L2924/01047 , H01L2924/0105 , H01L2924/01051 , H01L2924/01074 , H01L2924/01075 , H01L2924/01078 , H01L2924/01079 , H01L2924/01082 , H01L2924/0132 , H01L2924/01322 , H01L2924/01327 , H01L2924/0133 , H01L2924/0134 , H01L2924/014 , H01L2924/0665 , H01L2924/09701 , H01L2924/10253 , H01L2924/10329 , H01L2924/13091 , H01L2924/15311 , H01L2924/15724 , H01L2924/15747 , H01L2924/15787 , H01L2924/1579 , H01L2924/16152 , H01L2924/166 , H01L2924/181 , H01L2924/19041 , H01L2924/19043 , H01L2924/19105 , H05K3/3478 , H05K2201/0215 , H05K2203/0143 , H05K2203/0278 , H05K2203/0405 , H05K2203/0425 , Y10T428/12528 , Y10T428/12708 , Y10T428/12903 , H01L2924/00014 , H01L2924/05432 , H01L2924/00 , H01L2924/01007 , H01L2924/01031 , H01L2924/01022 , H01L2924/01026 , H01L2924/01049 , H01L2924/01083 , H01L2924/00012 , H01L2924/3512 , H01L2224/13111 , H01L2224/29099 , H01L2224/29199 , H01L2224/29299 , H01L2224/2929 , H01L2224/29298
Abstract: 将含有作为金属颗粒的Cu等颗粒和作为焊锡颗粒的Sn颗粒的焊锡材料压延而形成的箔适用于温度分层焊接中的高温侧的锡焊，用这种锡焊方法获得的半导体器件、电子器件在机械特性等方面具有优良的可靠性。
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公开(公告)号：CN1482956A
公开(公告)日：2004-03-17
申请号：CN01821243.3
申请日：2001-12-19
Applicant: 株式会社日立制作所
CPC classification number: H01L24/01 , B23K3/063 , B23K2101/40 , H01L24/27 , H01L24/29 , H01L24/33 , H01L24/73 , H01L24/75 , H01L24/83 , H01L2224/0401 , H01L2224/04026 , H01L2224/16225 , H01L2224/29 , H01L2224/29076 , H01L2224/29101 , H01L2224/29109 , H01L2224/29111 , H01L2224/2919 , H01L2224/292 , H01L2224/29211 , H01L2224/29311 , H01L2224/29347 , H01L2224/29499 , H01L2224/32225 , H01L2224/32245 , H01L2224/45124 , H01L2224/45144 , H01L2224/48091 , H01L2224/48227 , H01L2224/48247 , H01L2224/49171 , H01L2224/73265 , H01L2224/83101 , H01L2224/8319 , H01L2224/83801 , H01L2924/00011 , H01L2924/00013 , H01L2924/01004 , H01L2924/01005 , H01L2924/01006 , H01L2924/01012 , H01L2924/01013 , H01L2924/01014 , H01L2924/01019 , H01L2924/01024 , H01L2924/01027 , H01L2924/01028 , H01L2924/01029 , H01L2924/0103 , H01L2924/01032 , H01L2924/01033 , H01L2924/01039 , H01L2924/01042 , H01L2924/01046 , H01L2924/01047 , H01L2924/0105 , H01L2924/01051 , H01L2924/01074 , H01L2924/01075 , H01L2924/01078 , H01L2924/01079 , H01L2924/01082 , H01L2924/0132 , H01L2924/01322 , H01L2924/01327 , H01L2924/0133 , H01L2924/0134 , H01L2924/014 , H01L2924/0665 , H01L2924/09701 , H01L2924/10253 , H01L2924/10329 , H01L2924/13091 , H01L2924/15311 , H01L2924/15724 , H01L2924/15747 , H01L2924/15787 , H01L2924/1579 , H01L2924/16152 , H01L2924/166 , H01L2924/181 , H01L2924/19041 , H01L2924/19043 , H01L2924/19105 , H05K3/3478 , H05K2201/0215 , H05K2203/0143 , H05K2203/0278 , H05K2203/0405 , H05K2203/0425 , Y10T428/12528 , Y10T428/12708 , Y10T428/12903 , H01L2924/00014 , H01L2924/05432 , H01L2924/00 , H01L2924/01007 , H01L2924/01031 , H01L2924/01022 , H01L2924/01026 , H01L2924/01049 , H01L2924/01083 , H01L2924/00012 , H01L2924/3512 , H01L2224/13111 , H01L2224/29099 , H01L2224/29199 , H01L2224/29299 , H01L2224/2929 , H01L2224/29298
Abstract: 将含有作为金属颗粒的Cu等颗粒和作为焊锡颗粒的Sn颗粒的焊锡材料压延而形成的箔适用于温度分层焊接中的高温侧的锡焊，用这种锡焊方法获得的半导体器件、电子器件在机械特性等方面具有优良的可靠性。
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公开(公告)号：CN1443625A
公开(公告)日：2003-09-24
申请号：CN03120150.4
申请日：2003-03-10
Applicant: 株式会社日立制作所
IPC: B23K35/24
CPC classification number: H05K3/3484 , B23K35/0244 , B23K35/025 , B23K35/262 , H01L23/49816 , H01L24/73 , H01L24/81 , H01L2224/05548 , H01L2224/05568 , H01L2224/05573 , H01L2224/11334 , H01L2224/13022 , H01L2224/16225 , H01L2224/16235 , H01L2224/32225 , H01L2224/32245 , H01L2224/45124 , H01L2224/45144 , H01L2224/48091 , H01L2224/48227 , H01L2224/48247 , H01L2224/49171 , H01L2224/73204 , H01L2224/73265 , H01L2224/81801 , H01L2224/82 , H01L2224/85 , H01L2224/86 , H01L2924/01012 , H01L2924/01046 , H01L2924/01078 , H01L2924/01079 , H01L2924/01087 , H01L2924/01322 , H01L2924/01327 , H01L2924/09701 , H01L2924/10253 , H01L2924/12042 , H01L2924/13091 , H01L2924/14 , H01L2924/15153 , H01L2924/1517 , H01L2924/15311 , H01L2924/16152 , H01L2924/166 , H01L2924/181 , H01L2924/19041 , H01L2924/19105 , H05K2201/0215 , Y10T428/12181 , Y10T428/12708 , Y10T428/12715 , Y10T428/12722 , Y10T428/1275 , Y10T428/12889 , Y10T428/12896 , Y10T428/1291 , H01L2924/00 , H01L2924/00012 , H01L2924/00014
Abstract: 在一种在温度层级结合中实现高温端焊接结合的焊料中，半导体装置与衬底之间的连接部分通过由Cu之类构成的金属球以及由金属球和Sn构成的化合物而形成，并且金属球通过化合物而结合在一起。
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Patent Agency Ranking
公开(公告)号：CN1067929C
公开(公告)日：2001-07-04
申请号：CN95120505.6
申请日：1995-10-11
Applicant: 株式会社日立制作所
IPC: B23K35/26 , B23K101/36
CPC classification number: B23K35/262 , H05K3/3457 , Y10S228/903
Abstract: 用于将电子元件连接在有机基底上的无铅焊料，以重量%表示，它含3-5Zn、10-23Bi、余量为Sn。其固相线温度为160℃或更高，液相线温度为195℃或更低。本发明的无铅焊料还可由上述含量的Zn、Bi、Sn与1-5In、或1-3Ag、或Sb1-3、或Cu0.5-2、或与选自In、Ag、Sb和Cu中的至少两种元素1-10分别。该构成多种无铅焊料。还提供上述焊料将电子元件连接在有机基底上成为电子产品的用途焊料最高可在220-230℃焊接，且在150℃有可靠的机械强度。
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公开(公告)号：CN101337308B
公开(公告)日：2012-11-14
申请号：CN200810145147.4
申请日：2003-03-10
Applicant: 株式会社日立制作所
IPC: B23K35/24
CPC classification number: H05K3/3484 , B23K35/0244 , B23K35/025 , B23K35/262 , H01L23/49816 , H01L24/73 , H01L24/81 , H01L2224/05548 , H01L2224/05568 , H01L2224/05573 , H01L2224/11334 , H01L2224/13022 , H01L2224/16225 , H01L2224/16235 , H01L2224/32225 , H01L2224/32245 , H01L2224/45124 , H01L2224/45144 , H01L2224/48091 , H01L2224/48227 , H01L2224/48247 , H01L2224/49171 , H01L2224/73204 , H01L2224/73265 , H01L2224/81801 , H01L2224/82 , H01L2224/85 , H01L2224/86 , H01L2924/01012 , H01L2924/01046 , H01L2924/01078 , H01L2924/01079 , H01L2924/01087 , H01L2924/01322 , H01L2924/01327 , H01L2924/09701 , H01L2924/10253 , H01L2924/12042 , H01L2924/13091 , H01L2924/14 , H01L2924/15153 , H01L2924/1517 , H01L2924/15311 , H01L2924/16152 , H01L2924/166 , H01L2924/181 , H01L2924/19041 , H01L2924/19105 , H05K2201/0215 , Y10T428/12181 , Y10T428/12708 , Y10T428/12715 , Y10T428/12722 , Y10T428/1275 , Y10T428/12889 , Y10T428/12896 , Y10T428/1291 , H01L2924/00 , H01L2924/00012 , H01L2924/00014
Abstract: 本发明涉及一种焊料，在温度层级结合中实现高温端焊接结合，其中，半导体装置与衬底之间的连接部分通过由Cu之类构成的金属球以及由金属球和Sn构成的化合物而形成，并且金属球通过化合物而结合在一起。
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公开(公告)号：CN1298051C
公开(公告)日：2007-01-31
申请号：CN02128644.2
申请日：1998-12-09
Applicant: 株式会社日立制作所
CPC classification number: H05K1/181 , B23K1/0016 , B23K35/004 , B23K35/007 , B23K35/262 , B23K2101/40 , H01L23/488 , H01L23/49811 , H01L23/532 , H01L24/29 , H01L2224/83101 , H01L2924/01322 , H01L2924/15747 , H05K3/3426 , H05K3/3463 , H05K2201/10909 , Y02P70/613 , Y10T29/49144 , Y10T29/49149 , Y10T29/49169 , Y10T428/12708 , Y10T428/12715 , H01L2924/00
Abstract: 一种无Pb焊料连接结构和半导体装置，该无Pb焊料连接结构具有足够高的连接强度，获得即使在随时间的推移的情况下仍保持稳定的界面，保持足够的浸润性和对纤维状结晶的抵抗性。特别是，无Pb焊料的特征在于：作为代表性的无Pb焊料的Sn-Ag-Bi与电极连接，该电极的表面上形成有Sn-Bi层。最好，按照重量百分比计，上述Sn-Bi层中的Bi浓度在1～20%的范围内，以便获得足够高的浸润性。当要求更加可靠的接缝时，在上述Sn-Bi层的下面形成Cu层，以便获得具有足够高的界面强度的连接部。
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公开(公告)号：CN1269612C
公开(公告)日：2006-08-16
申请号：CN01821243.3
申请日：2001-12-19
Applicant: 株式会社日立制作所
CPC classification number: H01L24/01 , B23K3/063 , B23K2101/40 , H01L24/27 , H01L24/29 , H01L24/33 , H01L24/73 , H01L24/75 , H01L24/83 , H01L2224/0401 , H01L2224/04026 , H01L2224/16225 , H01L2224/29 , H01L2224/29076 , H01L2224/29101 , H01L2224/29109 , H01L2224/29111 , H01L2224/2919 , H01L2224/292 , H01L2224/29211 , H01L2224/29311 , H01L2224/29347 , H01L2224/29499 , H01L2224/32225 , H01L2224/32245 , H01L2224/45124 , H01L2224/45144 , H01L2224/48091 , H01L2224/48227 , H01L2224/48247 , H01L2224/49171 , H01L2224/73265 , H01L2224/83101 , H01L2224/8319 , H01L2224/83801 , H01L2924/00011 , H01L2924/00013 , H01L2924/01004 , H01L2924/01005 , H01L2924/01006 , H01L2924/01012 , H01L2924/01013 , H01L2924/01014 , H01L2924/01019 , H01L2924/01024 , H01L2924/01027 , H01L2924/01028 , H01L2924/01029 , H01L2924/0103 , H01L2924/01032 , H01L2924/01033 , H01L2924/01039 , H01L2924/01042 , H01L2924/01046 , H01L2924/01047 , H01L2924/0105 , H01L2924/01051 , H01L2924/01074 , H01L2924/01075 , H01L2924/01078 , H01L2924/01079 , H01L2924/01082 , H01L2924/0132 , H01L2924/01322 , H01L2924/01327 , H01L2924/0133 , H01L2924/0134 , H01L2924/014 , H01L2924/0665 , H01L2924/09701 , H01L2924/10253 , H01L2924/10329 , H01L2924/13091 , H01L2924/15311 , H01L2924/15724 , H01L2924/15747 , H01L2924/15787 , H01L2924/1579 , H01L2924/16152 , H01L2924/166 , H01L2924/181 , H01L2924/19041 , H01L2924/19043 , H01L2924/19105 , H05K3/3478 , H05K2201/0215 , H05K2203/0143 , H05K2203/0278 , H05K2203/0405 , H05K2203/0425 , Y10T428/12528 , Y10T428/12708 , Y10T428/12903 , H01L2924/00014 , H01L2924/05432 , H01L2924/00 , H01L2924/01007 , H01L2924/01031 , H01L2924/01022 , H01L2924/01026 , H01L2924/01049 , H01L2924/01083 , H01L2924/00012 , H01L2924/3512 , H01L2224/13111 , H01L2224/29099 , H01L2224/29199 , H01L2224/29299 , H01L2224/2929 , H01L2224/29298
Abstract: 将含有作为金属颗粒的Cu等颗粒和作为焊锡颗粒的Sn颗粒的焊锡材料压延而形成的箔适用于温度分层焊接中的高温侧的锡焊，用这种锡焊方法获得的半导体器件、电子器件在机械特性等方面具有优良的可靠性。
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公开(公告)号：CN1505137A
公开(公告)日：2004-06-16
申请号：CN02128644.2
申请日：1998-12-09
Applicant: 株式会社日立制作所
CPC classification number: H05K1/181 , B23K1/0016 , B23K35/004 , B23K35/007 , B23K35/262 , B23K2101/40 , H01L23/488 , H01L23/49811 , H01L23/532 , H01L24/29 , H01L2224/83101 , H01L2924/01322 , H01L2924/15747 , H05K3/3426 , H05K3/3463 , H05K2201/10909 , Y02P70/613 , Y10T29/49144 , Y10T29/49149 , Y10T29/49169 , Y10T428/12708 , Y10T428/12715 , H01L2924/00
Abstract: 一种无Pb焊料连接结构和半导体装置，该无Pb焊料连接结构具有足够高的连接强度，获得即使在随时间的推移的情况下仍保持稳定的界面，保持足够的浸润性和对纤维状结晶的抵抗性。特别是，无Pb焊料的特征在于：作为代表性的无Pb焊料的Sn－Ag－Bi与电极连接，该电极的表面上形成有Sn－Bi层。最好，按照重量百分比计，上述Sn－Bi层中的Bi浓度在1～20％的范围内，以便获得足够高的浸润性。当要求更加可靠的接缝时，在上述Sn－Bi层的下面形成Cu层，以便获得具有足够高的界面强度的连接部。
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