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公开(公告)号:CN102832144A
公开(公告)日:2012-12-19
申请号:CN201110353089.6
申请日:2011-11-09
Applicant: 台湾积体电路制造股份有限公司
IPC: H01L21/60
CPC classification number: H01L24/11 , H01L21/6836 , H01L24/13 , H01L24/16 , H01L24/81 , H01L2221/68327 , H01L2224/11003 , H01L2224/111 , H01L2224/1133 , H01L2224/11462 , H01L2224/1147 , H01L2224/11825 , H01L2224/11849 , H01L2224/119 , H01L2224/13022 , H01L2224/13082 , H01L2224/13111 , H01L2224/13139 , H01L2224/13147 , H01L2224/13155 , H01L2224/1357 , H01L2224/13655 , H01L2224/13671 , H01L2224/13672 , H01L2224/16145 , H01L2224/16225 , H01L2224/16227 , H01L2224/81193 , H01L2224/94 , H01L2224/97 , H01L2924/00014 , H01L2924/00012 , H01L2924/01029 , H01L2924/01083 , H01L2924/0103 , H01L2924/01047 , H01L2924/01082 , H01L2224/11
Abstract: 提供了形成金属凸块的系统和方法。实施例包括将导电材料附接于载体介质,然后将导电材料与衬底的导电区相接触。采用接合工艺将导电材料的部分接合至导电区以在导电区上形成导电帽,并去除剩余的导电材料和载体介质。采用回流工艺将导电帽回流成导电凸块。本发明还提供了一种金属凸块的形成。
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公开(公告)号:CN103515251B
公开(公告)日:2016-05-04
申请号:CN201310136202.4
申请日:2013-04-18
Applicant: 台湾积体电路制造股份有限公司
CPC classification number: H01L24/81 , H01L21/56 , H01L23/3107 , H01L23/3128 , H01L23/49811 , H01L23/49816 , H01L23/49833 , H01L24/05 , H01L24/13 , H01L24/16 , H01L24/17 , H01L25/0657 , H01L25/105 , H01L25/50 , H01L2224/0401 , H01L2224/13016 , H01L2224/13017 , H01L2224/13018 , H01L2224/13023 , H01L2224/13124 , H01L2224/13144 , H01L2224/13147 , H01L2224/13155 , H01L2224/13164 , H01L2224/13582 , H01L2224/13583 , H01L2224/13611 , H01L2224/13644 , H01L2224/13647 , H01L2224/13655 , H01L2224/13657 , H01L2224/13664 , H01L2224/16148 , H01L2224/16225 , H01L2224/16238 , H01L2224/16501 , H01L2224/16505 , H01L2224/32135 , H01L2224/32141 , H01L2224/32145 , H01L2224/81085 , H01L2224/811 , H01L2224/8112 , H01L2224/81121 , H01L2224/81193 , H01L2224/81232 , H01L2224/81355 , H01L2224/81359 , H01L2224/81801 , H01L2224/8192 , H01L2225/06513 , H01L2225/06517 , H01L2225/0652 , H01L2225/1023 , H01L2225/1058 , H01L2924/01027 , H01L2924/01028 , H01L2924/01029 , H01L2924/01046 , H01L2924/01047 , H01L2924/0105 , H01L2924/01079 , H01L2924/15311 , H01L2924/1533 , H01L2924/15331 , H01L2924/181 , H01L2924/1815 , H01L2924/18161 , H01L2924/3841 , H01L2924/00014 , H01L2924/00012 , H01L2924/01005 , H01L2924/01074 , H01L2924/01015 , H01L2924/06 , H01L2924/00
Abstract: 一种方法包括将第一封装元件的第一电连接件与第二封装元件的第二电连接件对准。随着第一电连接件与第二电连接件对准,在第一电连接件和第二电连接件上镀金属层。该金属层将第一电连接件接合到第二电连接件。本发明公开了通过镀层接合封装元件。
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公开(公告)号:CN103199027B
公开(公告)日:2016-05-04
申请号:CN201210102112.9
申请日:2012-04-09
Applicant: 台湾积体电路制造股份有限公司
IPC: H01L21/60 , H01L23/488
CPC classification number: H01L23/485 , H01L21/768 , H01L23/3192 , H01L24/03 , H01L24/05 , H01L24/13 , H01L2224/02166 , H01L2224/0401 , H01L2224/05008 , H01L2224/05022 , H01L2224/05027 , H01L2224/05155 , H01L2224/05164 , H01L2224/05541 , H01L2224/05548 , H01L2224/05552 , H01L2224/05571 , H01L2224/05572 , H01L2224/05583 , H01L2224/05644 , H01L2224/13017 , H01L2224/13022 , H01L2224/13023 , H01L2224/13027 , H01L2224/131 , H01L2924/00014 , H01L2924/00012 , H01L2924/207 , H01L2924/014
Abstract: 一种方法包括在金属焊盘上方形成聚合物层;在聚合物层中形成开口从而暴露出金属焊盘的一部分;以及形成凸块下金属化层(UBM)。该UBM包含延伸至开口内的电连接至金属焊盘的部分。本发明提供了用于集成电路的UBM的形成。
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公开(公告)号:CN102832144B
公开(公告)日:2015-10-07
申请号:CN201110353089.6
申请日:2011-11-09
Applicant: 台湾积体电路制造股份有限公司
IPC: H01L21/60
CPC classification number: H01L24/11 , H01L21/6836 , H01L24/13 , H01L24/16 , H01L24/81 , H01L2221/68327 , H01L2224/11003 , H01L2224/111 , H01L2224/1133 , H01L2224/11462 , H01L2224/1147 , H01L2224/11825 , H01L2224/11849 , H01L2224/119 , H01L2224/13022 , H01L2224/13082 , H01L2224/13111 , H01L2224/13139 , H01L2224/13147 , H01L2224/13155 , H01L2224/1357 , H01L2224/13655 , H01L2224/13671 , H01L2224/13672 , H01L2224/16145 , H01L2224/16225 , H01L2224/16227 , H01L2224/81193 , H01L2224/94 , H01L2224/97 , H01L2924/00014 , H01L2924/00012 , H01L2924/01029 , H01L2924/01083 , H01L2924/0103 , H01L2924/01047 , H01L2924/01082 , H01L2224/11
Abstract: 提供了形成金属凸块的系统和方法。实施例包括将导电材料附接于载体介质,然后将导电材料与衬底的导电区相接触。采用接合工艺将导电材料的部分接合至导电区以在导电区上形成导电帽,并去除剩余的导电材料和载体介质。采用回流工艺将导电帽回流成导电凸块。本发明还提供了一种金属凸块的形成。
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公开(公告)号:CN102593044B
公开(公告)日:2015-02-18
申请号:CN201110433918.1
申请日:2011-12-21
Applicant: 台湾积体电路制造股份有限公司
IPC: H01L21/768 , H01L21/28
CPC classification number: H01L24/11 , H01L24/13 , H01L24/16 , H01L24/81 , H01L2224/0345 , H01L2224/0361 , H01L2224/03912 , H01L2224/0401 , H01L2224/05027 , H01L2224/05166 , H01L2224/05181 , H01L2224/05186 , H01L2224/05572 , H01L2224/05647 , H01L2224/1145 , H01L2224/11452 , H01L2224/1146 , H01L2224/1147 , H01L2224/1181 , H01L2224/11824 , H01L2224/11827 , H01L2224/11849 , H01L2224/1308 , H01L2224/13083 , H01L2224/13109 , H01L2224/13111 , H01L2224/13139 , H01L2224/13144 , H01L2224/13147 , H01L2224/13155 , H01L2224/13164 , H01L2224/13565 , H01L2224/1357 , H01L2224/13583 , H01L2224/13693 , H01L2224/16225 , H01L2224/16227 , H01L2224/81191 , H01L2224/81815 , H01L2224/94 , H01L2924/00014 , H01L2924/12044 , H01L2924/1305 , H01L2924/1306 , H01L2924/14 , H01L2924/01047 , H01L2924/01024 , H01L2924/01028 , H01L2924/0105 , H01L2924/01079 , H01L2924/04941 , H01L2924/04953 , H01L2924/01073 , H01L2924/01049 , H01L2924/0103 , H01L2924/01025 , H01L2924/01022 , H01L2924/01032 , H01L2924/01078 , H01L2924/01012 , H01L2924/01013 , H01L2924/0104 , H01L2924/01046 , H01L2924/01082 , H01L2924/01029 , H01L2924/01083 , H01L2924/01051 , H01L2224/03 , H01L2224/11 , H01L2924/00012 , H01L2924/00 , H01L2224/05552
Abstract: 本公开涉及金属柱的制造。制造半导体器件的示例性方法包括的步骤有:提供具有接触焊盘的衬底;形成钝化层,其在衬底上方延伸并且在接触焊盘上有开口;在接触焊盘和部分钝化层上形成金属柱;在金属柱上方形成焊接层;以及使金属柱的侧壁与有机化合物发生反应,以在金属柱的侧壁上形成该有机化合物的自组装单层或自组装多层。
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公开(公告)号:CN102315182B
公开(公告)日:2014-05-14
申请号:CN201010621954.6
申请日:2010-12-29
Applicant: 台湾积体电路制造股份有限公司
CPC classification number: H01L24/13 , H01L21/563 , H01L23/3192 , H01L24/03 , H01L24/05 , H01L24/11 , H01L24/16 , H01L24/73 , H01L24/81 , H01L2224/0345 , H01L2224/03452 , H01L2224/0346 , H01L2224/03464 , H01L2224/0361 , H01L2224/03831 , H01L2224/03912 , H01L2224/03914 , H01L2224/0401 , H01L2224/05572 , H01L2224/05647 , H01L2224/1132 , H01L2224/1145 , H01L2224/11462 , H01L2224/11464 , H01L2224/1147 , H01L2224/11622 , H01L2224/11831 , H01L2224/11849 , H01L2224/11901 , H01L2224/13007 , H01L2224/13017 , H01L2224/13022 , H01L2224/1308 , H01L2224/13082 , H01L2224/13083 , H01L2224/131 , H01L2224/13147 , H01L2224/13155 , H01L2224/16145 , H01L2224/16225 , H01L2224/16227 , H01L2224/73204 , H01L2224/81801 , H01L2924/00014 , H01L2924/01006 , H01L2924/01013 , H01L2924/01019 , H01L2924/01029 , H01L2924/01033 , H01L2924/0105 , H01L2924/01072 , H01L2924/01082 , H01L2924/01322 , H01L2924/014 , H01L2924/10329 , H01L2924/14 , H01L2924/3512 , H01L2224/05552 , H01L2924/00 , H01L2224/1146
Abstract: 本发明实施例公开了一种半导体芯片及其制造方法,其中半导体芯片包含一导电凸块位于一半导体芯片上。提供一基材,其上具有一连接焊盘,该连接焊盘上具有一凸块下金属层。铜柱具有一顶面及凹型侧壁,该顶面具有一第一宽度。一镍层,具有一顶面及一底面,位于该铜柱的顶面上。该镍层的底面具有一第二宽度。第二宽度对第一宽度的比例为约0.93至1.07。一焊料位于该盖层的该顶面上。本发明可减少导电柱与焊料之间的界面因应力而产生的破裂。
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