Abstract:
To provide more test data during the manufacture of non-volatile memories and other integrated circuits, machine learning is used to generate virtual test values. Virtual test results are interpolated for one set of tests for devices on which the test is not performed based on correlations with other sets of tests.
Abstract:
Corner rounding of electrically conductive layers in a replacement electrode integration scheme can be alleviated by employing compositionally modulated sacrificial material layers. An alternating stack of insulating layers and compositionally modulated sacrificial material layers can be formed over a substrate. Each of the compositionally modulated sacrificial material layers has a vertical modulation of material composition such that each compositionally modulated sacrificial material layer provides greater resistance to conversion into a silicon-oxide-containing material at upper and lower portions thereof than at a middle portion thereof during a subsequent oxidation process. Bird's beak features can be formed with lesser dimensions, and electrically conductive layers formed by replacement of remaining portions of the sacrificial material layers with a conductive material can have less corner rounding. Reduction in corner rounding can increase effectiveness of the control gates for a three-dimensional memory device.