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公开(公告)号：US09424939B2
公开(公告)日：2016-08-23
申请号：US14920895
申请日：2015-10-23
Applicant: eMemory Technology Inc.
Inventor： Yu-Hsiung Tsai , Chun-Yuan Lo
CPC classification number: G11C16/14 , G11C16/16 , H02M1/14 , H02M3/07 , H03K19/018514
Abstract: The invention provides a non-volatile memory apparatus and an erasing method thereof. The non-volatile memory apparatus includes a plurality of memory sectors and a control voltage provider. The memory sectors disposed in a same well, wherein, each of the memory sectors includes a plurality of memory cells for respectively receiving a plurality of control line signals. The control voltage provider provides the control line signals to the memory cells of each of the first memory sectors. When an erasing operation is operated, one of the memory sectors is selected for erasing and the control voltage provider provides the control line signals of the selected memory sector with an erase control voltage and provides the control line signals of the un-selected memory sectors with a un-erase control voltage, voltage levels of the erase control voltage and the un-erase control voltage are different.
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公开(公告)号：US09384843B2
公开(公告)日：2016-07-05
申请号：US14743315
申请日：2015-06-18
Applicant: eMemory Technology Inc.
Inventor： Yu-Hsiung Tsai
IPC: G11C11/34 , G11C16/14 , H01L27/115 , G11C5/06 , H01L29/10 , H01L29/06 , G11C16/08 , H01L27/092 , H02M1/14 , G11C16/04 , G11C16/10 , G11C16/30 , G11C16/26 , H02M3/07
CPC classification number: G11C16/14 , G11C5/063 , G11C16/0433 , G11C16/08 , G11C16/10 , G11C16/26 , G11C16/30 , H01L27/092 , H01L27/11521 , H01L27/11526 , H01L29/0642 , H01L29/1095 , H02M1/14 , H02M3/07
Abstract: A nonvolatile memory includes a memory array. The memory array is connected to m word lines and (2+n) bit line pairs. These bit line pairs include an erase bit line pair, a program bit line pair and n data bit line pairs. Each word line is connected with (2+n) differential cells of a corresponding row. The (2+n) differential cells include an erase flag differential cell, a program flag differential cell and n data differential cells. The erase flag differential cell is connected with the erase bit line pair. The program flag differential cell is connected with the program line pair. The n data differential cells are connected with the data line pairs. The n data differential cells are determined as erased cells or programmed cells according to setting conditions of the erase flag differential cell and the program flag differential cell.
Abstract translation: 非易失性存储器包括存储器阵列。 存储器阵列连接到m个字线和（2 + n）个位线对。 这些位线对包括擦除位线对，程序位线对和n个数据位线对。 每个字线与相应行的（2 + n）个差分单元连接。 （2 + n）个差分单元包括擦除标志差分单元，程序标志差分单元和n个数据差分单元。 擦除标志差分单元与擦除位线对连接。 程序标志差分单元与程序行对相连。 n个数据差分单元与数据线对相连。 根据擦除标志差分单元和程序标志差分单元的设置条件，将n个数据差分单元确定为擦除单元或编程单元。
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公开(公告)号：US20140355353A1
公开(公告)日：2014-12-04
申请号：US13909187
申请日：2013-06-04
Applicant: eMemory Technology Inc.
Inventor： Yu-Hsiung Tsai , Yuan-Tai Lin , Chi-Yi Shao
IPC: G11C16/28
Abstract: A sensing method of a current sensing amplifier is provided used for determining a storing state of a cell of a non-volatile memory device during a read cycle. After a sensing node and a reference node are adjusted to a constant voltage, the sensing node and the reference node are maintained in a floating state. Then, the sensing node is connected with a data line to receive a cell current from the cell, and the reference node is connected with a reference current source to receive a reference current from the reference current source. When a reference voltage of the reference node reaches a preset voltage, the storing state of the cell is determined according to a relationship between a sensing voltage of the sensing node and the preset voltage.
Abstract translation: 提供电流检测放大器的感测方法，用于在读取周期期间确定非易失性存储器件的单元的存储状态。 在感测节点和参考节点被调整到恒定电压之后，感测节点和参考节点被保持在浮动状态。 然后，感测节点与数据线连接以从小区接收小区电流，并且参考节点与参考电流源连接以从参考电流源接收参考电流。 当参考节点的参考电压达到预设电压时，根据感测节点的感测电压与预设电压之间的关系来确定单元的存储状态。
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公开(公告)号：US08885405B2
公开(公告)日：2014-11-11
申请号：US13755045
申请日：2013-01-31
Applicant: eMemory Technology Inc.
Inventor： Che-Wei Chang , Chia-Fu Chang , Yu-Hsiung Tsai , Chia-Jung Hsu
CPC classification number: G11C16/10 , G11C11/5628 , G11C16/30
Abstract: A flash memory includes a program voltage generator, plural memory units, a current limiter, and a multi-bit program control unit. The program voltage generator is used for providing a constant program voltage during a detecting cycle and providing a dynamically-adjustable program voltage during a program cycle. The plural memory units output plural drain currents and plural data line voltages to plural data lines. The current limiter is used for receiving a reference current and a reference voltage, thereby controlling the plural drain currents. During the detecting cycle, a specified data line voltage of the plural data line voltages with the minimum voltage level is detected by the multi-bit program control unit. During the program cycle, the specified data line voltage is used as a feedback voltage, and the dynamically-adjustable program voltage is generated by the program voltage generator according to the feedback voltage.
Abstract translation: 闪速存储器包括编程电压发生器，多个存储器单元，限流器和多位程序控制单元。 程序电压发生器用于在检测周期期间提供恒定的编程电压，并在编程周期期间提供动态可调节的编程电压。 多个存储单元将多个漏极电流和多个数据线电压输出到多条数据线。 电流限制器用于接收参考电流和参考电压，从而控制多个漏极电流。 在检测周期期间，由多位程序控制单元检测具有最小电压电平的多条数据线电压的指定数据线电压。 在编程周期中，指定的数据线电压用作反馈电压，动态可调程序电压由编程电压发生器根据反馈电压产生。
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公开(公告)号：US08884673B1
公开(公告)日：2014-11-11
申请号：US14045883
申请日：2013-10-04
Applicant: eMemory Technology Inc.
Inventor： Chi-Yi Shao , Chi-Chang Lin , Yu-Hsiung Tsai
CPC classification number: H03L7/08 , H03K3/02315
Abstract: A clock trimming apparatus includes an oscillator, a judging unit, a latching unit, and a tracking unit. The oscillator has an input terminal receiving a bias signal and an output terminal generating a clock signal. After a frequency division is performed on the clock signal, the judging unit generates a frequency-divided signal. If the frequency-divided signal matches the reference signal, a pass signal generated by the judging unit is activated. The latching unit is used for generating a trimming completion signal. After the pass signal is activated, the trimming completion signal is activated. The tracking unit is used for counting a pulse number of the reference signal and providing the bias signal to the oscillator according to a trimming code. After the trimming completion signal is activated, the trimming code is stopped being adjusted.
Abstract translation: 时钟修剪装置包括振荡器，判断单元，锁存单元和跟踪单元。 振荡器具有接收偏置信号的输入端和产生时钟信号的输出端。 在对时钟信号执行分频之后，判断单元产生分频信号。 如果分频信号与参考信号匹配，则由判断单元产生的通过信号被激活。 闩锁单元用于产生修剪完成信号。 激活通过信号后，修整完成信号被激活。 跟踪单元用于对参考信号的脉冲数进行计数，并根据修整码将偏置信号提供给振荡器。 修整完成信号激活后，调整代码停止。
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Patent Agency Ranking
公开(公告)号：US09171856B2
公开(公告)日：2015-10-27
申请号：US14242022
申请日：2014-04-01
Applicant: eMemory Technology Inc.
Inventor： Yu-Hsiung Tsai
IPC: G11C11/34 , H01L27/115 , H01L29/423 , H01L29/49 , G11C5/14 , G11C16/04 , G11C16/28 , G11C16/30 , G11C7/12 , H01L21/28
CPC classification number: H01L27/11558 , G11C5/147 , G11C7/12 , G11C16/0408 , G11C16/0433 , G11C16/28 , G11C16/30 , H01L21/28273 , H01L27/11519 , H01L27/11521 , H01L29/42328 , H01L29/4916
Abstract: A bias voltage generator for providing a control voltage and a source line voltage to a memory array includes a reference voltage generating circuit and a voltage converting circuit. The reference voltage generating circuit receives a program signal or an erase signal, and generates a reference voltage. If the program signal is received by the reference voltage generating circuit, the reference voltage has a positive temperature coefficient. If the erase signal is received by the reference voltage generating circuit, the reference voltage has a negative temperature coefficient. The voltage converting circuit converts the reference voltage into the control voltage and the source line voltage. The voltage converting circuit enlarges the reference voltage by a first magnification so as to produce the source line voltage, and enlarges the reference voltage by a second magnification so as to produce the control voltage.
Abstract translation: 用于向存储器阵列提供控制电压和源极线电压的偏置电压发生器包括参考电压产生电路和电压转换电路。 参考电压产生电路接收编程信号或擦除信号，并产生参考电压。 如果编程信号由参考电压产生电路接收，则参考电压具有正温度系数。 如果由参考电压产生电路接收到擦除信号，则参考电压具有负温度系数。 电压转换电路将参考电压转换成控制电压和源极线电压。 电压转换电路通过第一倍率放大参考电压，以产生源极线电压，并且将基准电压放大第二放大率以产生控制电压。
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公开(公告)号：US20160148686A1
公开(公告)日：2016-05-26
申请号：US14877239
申请日：2015-10-07
Applicant: eMemory Technology Inc.
Inventor： Chia-Jung Hsu , Wein-Town Sun , Ching-Sung Yang , Chi-Yi Shao , Chun-Yuan Lo , Yu-Hsiung Tsai , Ching-Yuan Lin
IPC: G11C13/00
CPC classification number: G11C13/0069 , G11C13/0023 , G11C13/0026 , G11C13/0028 , G11C13/003 , G11C13/004 , G11C2013/0057 , G11C2013/0088 , G11C2213/78 , G11C2213/79 , G11C2213/82
Abstract: A memory cell array includes a first bit line, a first word line, a first source line pair and a first memory cell. A select terminal of the first memory cell is connected with the first word line. A first control terminal of the first memory cell is connected with a first source line of the first source line pair. A second control terminal of the first memory cell is connected with a second source line of the first source line pair. A third control terminal of the first memory cell is connected with the first bit line.
Abstract translation: 存储单元阵列包括第一位线，第一字线，第一源极线对和第一存储器单元。 第一存储单元的选择端与第一字线连接。 第一存储单元的第一控制端与第一源极线对的第一源极线连接。 第一存储单元的第二控制端与第一源极线对的第二源极线连接。 第一存储单元的第三控制端与第一位线连接。
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公开(公告)号：US09196367B2
公开(公告)日：2015-11-24
申请号：US14295358
申请日：2014-06-04
Applicant: eMemory Technology Inc.
Inventor： Yu-Hsiung Tsai , Chun-Yuan Lo
CPC classification number: G11C16/14 , G11C16/16 , H02M1/14 , H02M3/07 , H03K19/018514
Abstract: The invention provides a non-volatile memory apparatus and an erasing method thereof. The non-volatile memory apparatus includes a plurality of memory sectors and a control voltage provider. The memory sectors disposed in a same well, wherein, each of the memory sectors includes a plurality of memory cells for respectively receiving a plurality of control line signals. The control voltage provider provides the control line signals to the memory cells of each of the first memory sectors. When an erasing operation is operated, one of the memory sectors is selected for erasing and the control voltage provider provides the control line signals of the selected memory sector with an erase control voltage and provides the control line signals of the un-selected memory sectors with a un-erase control voltage, voltage levels of the erase control voltage and the un-erase control voltage are different.
Abstract translation: 本发明提供一种非易失性存储装置及其擦除方法。 非易失性存储装置包括多个存储器扇区和控制电压提供器。 设置在同一个井中的存储器扇区，其中每个存储器扇区包括用于分别接收多个控制线信号的多个存储单元。 控制电压提供器将控制线信号提供给每个第一存储器扇区的存储单元。 当擦除操作被操作时，选择一个存储器扇区用于擦除，并且控制电压提供器提供所选择的存储器扇区的控制线信号的擦除控制电压，并且向未选择的存储器扇区提供控制线信号 擦除控制电压，擦除控制电压和解除擦除控制电压的电压电平不同。
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公开(公告)号：US20150287467A1
公开(公告)日：2015-10-08
申请号：US14295358
申请日：2014-06-04
Applicant: eMemory Technology Inc.
Inventor： Yu-Hsiung Tsai , Chun-Yuan Lo
IPC: G11C16/14
CPC classification number: G11C16/14 , G11C16/16 , H02M1/14 , H02M3/07 , H03K19/018514
Abstract: The invention provides a non-volatile memory apparatus and an erasing method thereof The non-volatile memory apparatus includes a plurality of memory sectors and a control voltage provider. The memory sectors disposed in a same well, wherein, each of the memory sectors includes a plurality of memory cells for respectively receiving a plurality of control line signals. The control voltage provider provides the control line signals to the memory cells of each of the first memory sectors. When an erasing operation is operated, one of the memory sectors is selected for erasing and the control voltage provider provides the control line signals of the selected memory sector with an erase control voltage and provides the control line signals of the un-selected memory sectors with a un-erase control voltage, voltage levels of the erase control voltage and the un-erase control voltage are different.
Abstract translation: 本发明提供了一种非易失性存储装置及其擦除方法。非易失性存储装置包括多个存储器扇区和控制电压提供器。 设置在同一个井中的存储器扇区，其中每个存储器扇区包括用于分别接收多个控制线信号的多个存储单元。 控制电压提供器将控制线信号提供给每个第一存储器扇区的存储单元。 当擦除操作被操作时，选择一个存储器扇区用于擦除，并且控制电压提供器提供所选择的存储器扇区的控制线信号的擦除控制电压，并且向未选择的存储器扇区提供控制线信号 擦除控制电压，擦除控制电压和解除擦除控制电压的电压电平不同。
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公开(公告)号：US09099191B2
公开(公告)日：2015-08-04
申请号：US13909187
申请日：2013-06-04
Applicant: eMemory Technology Inc.
Inventor： Yu-Hsiung Tsai , Yuan-Tai Lin , Chi-Yi Shao
IPC: G11C16/28
Abstract: A sensing method of a current sensing amplifier is provided used for determining a storing state of a cell of a non-volatile memory device during a read cycle. After a sensing node and a reference node are adjusted to a constant voltage, the sensing node and the reference node are maintained in a floating state. Then, the sensing node is connected with a data line to receive a cell current from the cell, and the reference node is connected with a reference current source to receive a reference current from the reference current source. When a reference voltage of the reference node reaches a preset voltage, the storing state of the cell is determined according to a relationship between a sensing voltage of the sensing node and the preset voltage.
Abstract translation: 提供电流检测放大器的感测方法，用于在读取周期期间确定非易失性存储器件的单元的存储状态。 在感测节点和参考节点被调整到恒定电压之后，感测节点和参考节点被保持在浮动状态。 然后，感测节点与数据线连接以从小区接收小区电流，并且参考节点与参考电流源连接以从参考电流源接收参考电流。 当参考节点的参考电压达到预设电压时，根据感测节点的感测电压与预设电压之间的关系来确定单元的存储状态。
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