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公开(公告)号:US08971360B2
公开(公告)日:2015-03-03
申请号:US14098792
申请日:2013-12-06
Applicant: Exalos AG
Inventor: Jan Lewandowski , Marcus Duelk , Christian Velez
IPC: H01S3/10 , H01S5/06 , G01N21/47 , H01S5/14 , G01B9/02 , H01S5/022 , H01S5/024 , H01S5/0683 , H01S3/081
CPC classification number: H01S5/06 , G01B9/02004 , G01B9/02091 , G01N21/4795 , H01S3/0813 , H01S5/02216 , H01S5/02248 , H01S5/02284 , H01S5/02415 , H01S5/02438 , H01S5/0683 , H01S5/141 , H01S5/143
Abstract: An optical module includes a light source. The light source can be a swept wavelength light source, and optical module includes a wavemeter. The wavemeter includes a wavemeter tap capable of directing a wavemeter portion of light produced by the light source away from a main beam, a wavelength selective filter arranged to receive the wavemeter portion, a first wavemeter detector arranged to measure a transmitted radiation intensity of radiation transmitted through the filter, and a second wavemeter detector arranged to measure a non-transmitted radiation intensity of radiation not transmitted through but reflected by the filter. In addition, an optical coherence tomography apparatus includes the optical module.
Abstract translation: 光学模块包括光源。 光源可以是扫描波长光源,光学模块包括波长计。 波长计包括能够将由光源产生的光的波长计部分引导远离主光束的波长计分接头,布置成接收波长计部分的波长选择滤波器,布置成测量发射的辐射的透射辐射强度的第一波长计检测器 以及第二波长计检测器,其布置成测量不透过但被滤光器反射的辐射的未透射辐射强度。 另外,光学相干断层摄影装置包括光学模块。
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公开(公告)号:US11158758B2
公开(公告)日:2021-10-26
申请号:US16511374
申请日:2019-07-15
Applicant: EXALOS AG
Inventor: Antonino Francesco Castiglia , Marco Rossetti , Marco Malinverni , Marcus Dülk , Christian Velez
IPC: H01S5/22 , H01S5/0233 , H01L31/18 , H01S5/30 , H01S5/50 , H01S5/02 , H01L33/00 , H01L25/075 , H01S5/023 , H01S5/40
Abstract: Superluminescent light emitting diode, SLED, devices and modules are provided. A multi-wavelength SLED device is fabricated by sequentially depositing adjacent epitaxial stacks onto a substrate to form a monolithic chip structure. Each epitaxial stack includes n-type layers, active layers and p-type layers. A ridge is formed in the p-type layers between the end facets of the chip to induce a waveguiding region in the active layers. Different ones of the epitaxial stacks emit at different wavelength ranges. A module is made by packaging one of the above SLED devices with another SLED device, with one inverted relative to the other to form a triangle of emitters as viewed end on, for example a triangle of red, green and blue emitters. The SLED devices and modules may find use in projection, endoscopic, fundus imaging and optical coherence tomography systems.
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公开(公告)号:US11670914B2
公开(公告)日:2023-06-06
申请号:US17321843
申请日:2021-05-17
Applicant: EXALOS AG
Inventor: Antonino Francesco Castiglia , Marco Rossetti , Marco Malinverni , Marcus Pierre Dülk , Christian Velez
CPC classification number: H01S5/4031 , H01S5/042 , H01S5/0625 , H01S5/1021 , H01S5/1039 , H01S5/2018 , H01S5/22 , H01S5/343
Abstract: An edge-emitting semiconductor laser diode chip 15 with mutually opposed front and back end facet mirrors 22, 24. First and second ridges 261, 262 extend between the chip end facets 22, 24 to define first and second waveguides in an active region layer. Low and high slope efficiency laser diodes are thus formed that are independently drivable by respective electrode pairs 211, 231 and 212, 232. The single chip 15 thus incorporates two laser diodes sharing a common heterostructure, one with low slope efficiency optimized for low power operation with good power stability against temperature variations and random threshold current fluctuations in the close-to-threshold power regime, and the other with high slope efficiency optimized for high wall plug efficiency operation at higher output powers when the chip is operating far above threshold.
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公开(公告)号:US11131795B2
公开(公告)日:2021-09-28
申请号:US16707059
申请日:2019-12-09
Applicant: EXALOS AG
Inventor: Marcus Dülk , Jean Dahdah , Stefan Gloor , Nikolay Primerov , Christian Velez
Abstract: A module accommodates multiple superluminescent light emitting diodes, SLEDs, 12r, 12g and 12b. The SLEDs are arranged in an enclosure and output respective light beams to propagate into free space within the enclosure. The individual light beams from the SLED sources are combined into a single beam path within the enclosure using beam combiners 40r-g, 40rg-b. Each beam combiner is realized as a planar optical element, the back side of which is arranged to receive a SLED beam and route it through the optical element to the front side where it is combined with another SLED beam that is incident on and reflected by the front side. The free-space propagating combined beam is output from the module via an optical fiber 42 (or through a window).
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公开(公告)号:US20130128232A1
公开(公告)日:2013-05-23
申请号:US13739725
申请日:2013-01-11
Applicant: EXALOS AG
Inventor: Valerio Laino , Lorenzo Occhi , Christian Velez
IPC: G03B21/00
CPC classification number: G03B21/005 , G02B27/1026 , G02B27/1033 , G02B27/1046 , G02B27/141 , G02B27/149 , G03B21/2033 , G03B21/28 , G03B33/12 , H04N9/30
Abstract: In accordance with the invention, a display apparatus comprising a light source is provided, said light source comprising at least one superluminescent light emitting diode (SLED), the apparatus further comprising at least one light modulating device arranged in a beam path of a light beam emitted by said light source and operable to emit influenced light upon incidence of said light beam, the light modulating device being operatively connected to an electronic control, the display apparatus further comprising a projection optics arranged in a beam path of said influenced light.
Abstract translation: 根据本发明,提供了一种包括光源的显示装置,所述光源包括至少一个超发光发光二极管(SLED),所述装置还包括至少一个光调制装置,其布置在光束的光束路径中 由所述光源发射并可操作以在所述光束入射时发射受影响的光,所述光调制装置可操作地连接到电子控制器,所述显示装置还包括布置在所述受影响光束的光束路径中的投影光学元件。
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公开(公告)号:US11918376B2
公开(公告)日:2024-03-05
申请号:US17467348
申请日:2021-09-06
Applicant: EXALOS AG
Inventor: Marcus Dülk , Jean Dahdah , Stefan Gloor , Nikolay Primerov , Christian Velez
CPC classification number: A61B5/6803 , A61B1/046 , A61B1/0638 , A61B3/12 , A61B5/0066 , G02B6/0006 , G02B27/1006 , G02B27/126
Abstract: A module accommodates multiple superluminescent light emitting diodes, SLEDs, 12r, 12g and 12b. The SLEDs are arranged in an enclosure and output respective light beams to propagate into free space within the enclosure. The individual light beams from the SLED sources are combined into a single beam path within the enclosure using beam combiners 40r-g, 40rg-b. Each beam combiner is realized as a planar optical element, the back side of which is arranged to receive a SLED beam and route it through the optical element to the front side where it is combined with another SLED beam that is incident on and reflected by the front side. The free-space propagating combined beam is output from the module via an optical fiber 42 (or through a window).
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公开(公告)号:US20200185884A1
公开(公告)日:2020-06-11
申请号:US16511374
申请日:2019-07-15
Applicant: EXALOS AG
Inventor: Antonino Francesco Castiglia , Marco Rossetti , Marco Malinverni , Marcus Dülk , Christian Velez
Abstract: Superluminescent light emitting diode, SLED, devices and modules are provided. A multi-wavelength SLED device is fabricated by sequentially depositing adjacent epitaxial stacks onto a substrate to form a monolithic chip structure. Each epitaxial stack includes n-type layers, active layers and p-type layers. A ridge is formed in the p-type layers between the end facets of the chip to induce a waveguiding region in the active layers. Different ones of the epitaxial stacks emit at different wavelength ranges. A module is made by packaging one of the above SLED devices with another SLED device, with one inverted relative to the other to form a triangle of emitters as viewed end on, for example a triangle of red, green and blue emitters. The SLED devices and modules may find use in projection, endoscopic, fundus imaging and optical coherence tomography systems.
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公开(公告)号:US10193310B2
公开(公告)日:2019-01-29
申请号:US15283410
申请日:2016-10-02
Applicant: EXALOS AG
Inventor: Antonino Francesco Castiglia , Marco Rossetti , Marcus Dülk , Christian Velez
Abstract: A low power, side-emitting semiconductor laser diode is provided. The laser diode is formed from a semiconductor heterostructure having an active layer sandwiched between an n-type layer and a p-type layer, wherein the active layer forms a gain medium of width W. Front and back reflectors of reflectivity Rf and Rb are arranged on opposing side facets of the semiconductor heterostructure part to form a cavity of length L containing at least a part of the active layer which thus forms the gain medium for the laser diode, the gain medium having an internal loss αi. To achieve stable, low power operation close to threshold, the laser diode is configured with the following parameter combination: width W: 1 μm≤W≤2 μm; cavity length L: 100 μm≤L≤600 μm; internal loss αi: 0 cm−1≤αi≤30 cm−1; back reflectivity Rb: 100≥Rb≥80%; and front reflectivity Rf: 100≥Rf≥60%.
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公开(公告)号:US20140098829A1
公开(公告)日:2014-04-10
申请号:US14098792
申请日:2013-12-06
Applicant: EXALOS AG
Inventor: Jan Lewandowski , Marcus Duelk , Christian Velez
IPC: H01S5/06
CPC classification number: H01S5/06 , G01B9/02004 , G01B9/02091 , G01N21/4795 , H01S3/0813 , H01S5/02216 , H01S5/02248 , H01S5/02284 , H01S5/02415 , H01S5/02438 , H01S5/0683 , H01S5/141 , H01S5/143
Abstract: An optical module includes a light source. The light source can be a swept wavelength light source, and optical module includes a wavemeter. The wavemeter includes a wavemeter tap capable of directing a wavemeter portion of light produced by the light source away from a main beam, a wavelength selective filter arranged to receive the wavemeter portion, a first wavemeter detector arranged to measure a transmitted radiation intensity of radiation transmitted through the filter, and a second wavemeter detector arranged to measure a non-transmitted radiation intensity of radiation not transmitted through but reflected by the filter. In addition, an optical coherence tomography apparatus includes the optical module.
Abstract translation: 光学模块包括光源。 光源可以是扫描波长光源,光学模块包括波长计。 波长计包括能够将由光源产生的光的波长计部分引导离开主波束的波长计分接头,布置成接收波长计部分的波长选择滤波器,布置成测量发射的辐射的透射辐射强度的第一波长计检测器 以及第二波长计检测器,其布置成测量不透过但被滤光器反射的辐射的未透射辐射强度。 另外,光学相干断层摄影装置包括光学模块。
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