MEASUREMENT OF DC OFFSETS IN IQ MODULATORS
    1.
    发明申请
    MEASUREMENT OF DC OFFSETS IN IQ MODULATORS 有权
    IQ调制器中DC偏置的测量

    公开(公告)号:US20140241407A1

    公开(公告)日:2014-08-28

    申请号:US13774565

    申请日:2013-02-22

    Inventor: Zoltan Azary

    CPC classification number: H04B17/104 H03C3/40 H04L27/364 H04L27/3854

    Abstract: Described are systems and methods of determining DC offset voltages in IQ modulators. First, two different DC test voltages are selected for one of the inputs to the IQ modulator. Then, a first test voltage is applied to one input to the IQ modulator while test data is generated by measuring outputs from a set of signals applied to the other input to the IQ modulator. Then the second test voltage is applied and another set of test data generated. From the first and second sets of test data, second-order polynomial functions may be constructed and compared to one another to yield a ratio of power value outputs. Then the DC offset voltages may be determined from the ratio of power value outputs.

    Abstract translation: 描述了在IQ调制器中确定DC偏移电压的系统和方法。 首先,为IQ调制器的输入之一选择两个不同的直流测试电压。 然后,通过测量从施加到IQ调制器的另一个输入的一组信号的输出来产生测试数据,将第一测试电压施加到IQ调制器的一个输入。 然后施加第二个测试电压,并产生另一组测试数据。 从第一组和第二组测试数据中,可以构造二阶多项式函数并将其相互比较以产生功率值输出的比率。 然后可以根据功率值输出的比率来确定DC偏移电压。

    Measurement of DC offsets in IQ modulators
    2.
    发明授权
    Measurement of DC offsets in IQ modulators 有权
    IQ调制器中直流偏移的测量

    公开(公告)号:US09025648B2

    公开(公告)日:2015-05-05

    申请号:US13774565

    申请日:2013-02-22

    Inventor: Zoltan Azary

    CPC classification number: H04B17/104 H03C3/40 H04L27/364 H04L27/3854

    Abstract: Described are systems and methods of determining DC offset voltages in IQ modulators. First, two different DC test voltages are selected for one of the inputs to the IQ modulator. Then, a first test voltage is applied to one input to the IQ modulator while test data is generated by measuring outputs from a set of signals applied to the other input to the IQ modulator. Then the second test voltage is applied and another set of test data generated. From the first and second sets of test data, second-order polynomial functions may be constructed and compared to one another to yield a ratio of power value outputs. Then the DC offset voltages may be determined from the ratio of power value outputs.

    Abstract translation: 描述了在IQ调制器中确定DC偏移电压的系统和方法。 首先,为IQ调制器的输入之一选择两个不同的直流测试电压。 然后,通过测量从施加到IQ调制器的另一个输入的一组信号的输出来产生测试数据,将第一测试电压施加到IQ调制器的一个输入。 然后施加第二个测试电压,并产生另一组测试数据。 从第一组和第二组测试数据中,可以构造二阶多项式函数并将其相互比较以产生功率值输出的比率。 然后可以根据功率值输出的比率来确定DC偏移电压。

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