Memory device and system including the same

    公开(公告)号:US09703628B2

    公开(公告)日:2017-07-11

    申请号:US14831442

    申请日:2015-08-20

    Applicant: SK hynix Inc.

    Inventor: Ju Hyeon Han

    CPC classification number: G06F11/1048 G06F11/00 G06F12/00 G11C2029/0411

    Abstract: Disclosed is a memory device including: a plurality of memory blocks suitable for storing data; peripheral circuits suitable for temporarily storing data read from a selected memory block, performing a randomization operation to the read data, and performing an ECC decoding operation to the randomized data; and a control logic suitable for controlling the peripheral circuits to repeat the randomization operation and the ECC decoding operation until the ECC decoding operation is successful, and a system including the same.

    Data storage device and operating method thereof

    公开(公告)号:US09646707B1

    公开(公告)日:2017-05-09

    申请号:US15240810

    申请日:2016-08-18

    Applicant: SK hynix Inc.

    CPC classification number: G11C16/26 G11C11/5642 G11C16/08 G11C16/16

    Abstract: A data storage device includes a nonvolatile memory device including a nonvolatile memory device including a plurality of memory blocks each having a plurality of memory cells and a controller suitable for determining whether a target memory block for a read operation among the memory blocks is an open block, adjusting a pass bias to be applied to unselected memory cells during the read operation for the target memory block, according to a result of the determination, and controlling the nonvolatile memory device to perform the read operation using the adjusted pass bias.

    Memory system and operating method of the memory system

    公开(公告)号:US11295830B2

    公开(公告)日:2022-04-05

    申请号:US16865039

    申请日:2020-05-01

    Applicant: SK hynix Inc.

    Inventor: Ju Hyeon Han

    Abstract: There are provided a memory system and an operating method of the memory system. The memory system includes: a memory device including a plurality of memory blocks; and a memory controller for controlling the memory device to detect an initial bad block by performing an initial test operation on the plurality of memory blocks. The memory controller registers and manages, as a weak memory block, memory blocks physically adjacent to the detected initial bad block.

    Method of operating semiconductor memory device and memory system including semiconductor memory device

    公开(公告)号:US09727401B2

    公开(公告)日:2017-08-08

    申请号:US14815143

    申请日:2015-07-31

    Applicant: SK hynix Inc.

    Inventor: Ju Hyeon Han

    CPC classification number: G06F11/076 G06F11/073

    Abstract: Disclosed is a method of operating a semiconductor memory device including a plurality of pages, including: receiving a program command, an address, and program data; reading page data from a selected page corresponding to the address in response to the program command; determining whether the number of bits of data corresponding to a program state among the page data is greater than a threshold value; and outputting a state fail signal without performing a program operation on the selected page based on a result of the determination.

    Data storage device and operating method thereof

    公开(公告)号:US10249383B2

    公开(公告)日:2019-04-02

    申请号:US15447310

    申请日:2017-03-02

    Applicant: SK hynix Inc.

    Abstract: A data storage device includes a nonvolatile memory device; and a control unit suitable for controlling a program operation for memory cells of a page of the nonvolatile memory device, and processing a program fail in the case where the program operation fails, wherein the control unit adjusts a read voltage for discriminating an erase state and a program state having a threshold voltage most adjacent to the erase state, reads out data by applying the adjusted read voltage to the memory cells of the page, and performs an error handling operation to data stored in the memory cells of the page according to a result of comparing a reference value and a number of flipped bits of the data read out by applying the varied read voltage.

    Semiconductor device and method of operating the same according to degree of deterioration
    7.
    发明授权
    Semiconductor device and method of operating the same according to degree of deterioration 有权
    根据劣化程度的半导体装置及其操作方法

    公开(公告)号:US09569142B2

    公开(公告)日:2017-02-14

    申请号:US14696003

    申请日:2015-04-24

    Applicant: SK hynix Inc.

    Inventor: Ju Hyeon Han

    Abstract: A semiconductor device and a method of operating the same are provided. The method includes determining the degree of deterioration of a selected memory block, performing a program operation of the selected memory block in a first program operating condition when it is determined that the selected memory block is not deteriorated and performing the program operation of the selected memory block in a second program operating condition when it is determined that the selected memory is deteriorated, and updating the program operating time of the selected memory block.

    Abstract translation: 提供半导体器件及其操作方法。 该方法包括:当确定所选择的存储块不恶化并执行所选存储器的编程操作时,确定所选存储块的劣化程度,在第一程序操作条件下执行所选存储块的编程操作 当确定所选择的存储器恶化并更新所选择的存储块的程序操作时间时,在第二程序操作条件下阻止。

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