Image sensing device
    1.
    发明授权

    公开(公告)号:US11317048B2

    公开(公告)日:2022-04-26

    申请号:US16657364

    申请日:2019-10-18

    Applicant: SK hynix Inc.

    Inventor: Hyeon-June Kim

    Abstract: An image sensing device is provided to comprise: an image sensing region including a first pixel and a second pixel that produce a first pixel signal and a second pixel signal, respectively, in response to reception of light incident on the image sensing region; and a signal processing circuit electrically coupled to the image sensing region and operable to convert the first pixel signal and the second pixel signal to a first digital output and a second digital output, respectively, the signal processing circuit including a first node configured to receive the first pixel signal and the second pixel signal and a second node configured to receive ramp signals used for conversion of the first pixel signal and the second pixel signal.

    Ramp signal generation device and CMOS image sensor using the same

    公开(公告)号:US10805568B2

    公开(公告)日:2020-10-13

    申请号:US16218941

    申请日:2018-12-13

    Applicant: SK hynix Inc.

    Inventor: Hyeon-June Kim

    Abstract: A ramp signal generation device may be provided to include a ramp signal generator including a plurality of local ramp signal generators, each local ramp signal generator structured to generate a local ramp signals having a local ramp range based on a control of an external control unit, an AC coupler coupled to the ramp signal generator to receive local ramp signals from the ramp signal generator, the AC couple structured to perform AC coupling on the received local ramp signals and generate AC-coupled ramp signals, and an integrator coupled to the AC coupler to receive the AC-coupled ramp signals and structured to integrate the AC-coupled ramp signals into a ramp signal having a full ramp range.

    Comparator and image sensing device including the same

    公开(公告)号:US11330214B2

    公开(公告)日:2022-05-10

    申请号:US16716110

    申请日:2019-12-16

    Applicant: SK hynix Inc.

    Inventor: Hyeon-June Kim

    Abstract: A comparator is provided to comprise a comparison circuit including a first transistor configured to receive a ramp signal and a second transistor configured to receive a pixel signal, the comparison circuit configured to compare the ramp signal and the pixel signal and output a comparison signal at an output node, and an output swing control circuit including a third transistor coupled to the first transistor and the second transistor, and the output swing control circuit including a current path to decrease an amount of current flowing through the second transistor.

    IMAGE SENSING DEVICE
    5.
    发明申请

    公开(公告)号:US20200304744A1

    公开(公告)日:2020-09-24

    申请号:US16657364

    申请日:2019-10-18

    Applicant: SK hynix Inc.

    Inventor: Hyeon-June Kim

    Abstract: An image sensing device is provided to comprise: an image sensing region including a first pixel and a second pixel that produce a first pixel signal and a second pixel signal, respectively, in response to reception of light incident on the image sensing region; and a signal processing circuit electrically coupled to the image sensing region and operable to convert the first pixel signal and the second pixel signal to a first digital output and a second digital output, respectively, the signal processing circuit including a first node configured to receive the first pixel signal and the second pixel signal and a second node configured to receive ramp signals used for conversion of the first pixel signal and the second pixel signal.

    COMPARISON DEVICE AND CMOS IMAGE SENSOR INCLUDING THE SAME

    公开(公告)号:US20190335128A1

    公开(公告)日:2019-10-31

    申请号:US16219246

    申请日:2018-12-13

    Applicant: SK hynix Inc.

    Abstract: Provided are a comparison device that may minimize an influence of banding noise by offsetting the banding noise, and a CMOS image sensor including the comparison device. The comparison device may include a comparison circuit configured to compare a pixel signal and a ramp signal with each other and output a comparison signal, a banding noise adjustment circuit coupled to the comparison circuit to adjust electrical characteristic values of the comparison circuit, a banding value generation circuit coupled to the banding noise adjustment circuit to provide the banding noise adjustment circuit with a banding value generated based on a setting code value, and a banding noise reduction circuit coupled to the banding noise adjustment circuit and configured to reduce the banding noise of the comparison circuit by adjusting electrical characteristic values of the comparison circuit.

    SINGLE-SLOPE COMPARISON DEVICE WITH HIGH RESOLUTION AND LOW NOISE AND CMOS IMAGE SENSOR INCLUDING THE SAME

    公开(公告)号:US20190281244A1

    公开(公告)日:2019-09-12

    申请号:US16218206

    申请日:2018-12-12

    Applicant: SK hynix Inc.

    Abstract: A comparison device includes a multi-step pixel signal generation circuit coupled to a pixel to receive a pixel signal and generate a multi-step pixel signal based on the pixel signal according to a multi-step trigger signal and a multi-step size control signal; a comparison circuit coupled to the multi-step pixel signal generation circuit to compare a ramp signal with the multi-step pixel signal and output a comparison signal; and a control circuit coupled to the multi-step pixel signal generation circuit and the comparison circuit to detect crossings of the multi-step pixel signal and the ramp signal based on the comparison signal from the comparison circuit and output the multi-step size control signal to the multi-step pixel signal generation circuit.

    Comparison device and CMOS image sensor including the same

    公开(公告)号:US10757356B2

    公开(公告)日:2020-08-25

    申请号:US16219246

    申请日:2018-12-13

    Applicant: SK hynix Inc.

    Abstract: Provided are a comparison device that may minimize an influence of banding noise by offsetting the banding noise, and a CMOS image sensor including the comparison device. The comparison device may include a comparison circuit configured to compare a pixel signal and a ramp signal with each other and output a comparison signal, a banding noise adjustment circuit coupled to the comparison circuit to adjust electrical characteristic values of the comparison circuit, a banding value generation circuit coupled to the banding noise adjustment circuit to provide the banding noise adjustment circuit with a banding value generated based on a setting code value, and a banding noise reduction circuit coupled to the banding noise adjustment circuit and configured to reduce the banding noise of the comparison circuit by adjusting electrical characteristic values of the comparison circuit.

    Single-slope comparison device with low-noise, and analog-to-digital conversion device and CMOS image sensor including the same

    公开(公告)号:US10681297B2

    公开(公告)日:2020-06-09

    申请号:US16154492

    申请日:2018-10-08

    Applicant: SK hynix Inc.

    Abstract: A comparison device includes an offset generation circuit that includes an input port to receive an offset control signal and is structured to generate an offset based on the received offset control signal; a comparison circuit comprising a first input port coupled to the offset generation circuit to receive a first input signal and a second input port coupled to receive a second input signal that is offset by the offset generated by the offset generation circuit and operable to compare the first input signal with the second input signal to produce a comparison signal; and a control circuit coupled to the comparison circuit to receive the comparison signal and operable to detect a crossing of the first input signal and the second input signal according to the comparison signal circuit and to output the offset control signal to the offset generation circuit.

    SUCCESSIVE APPROXIMATION REGISTER ANALOG-DIGITAL CONVERTER AND SAR ADC SYSTEM

    公开(公告)号:US20190166325A1

    公开(公告)日:2019-05-30

    申请号:US16204963

    申请日:2018-11-29

    Applicant: SK hynix Inc.

    Inventor: Hyeon-June Kim

    Abstract: A successive approximation register (SAR) analog-digital converter (ADC) may include a comparison circuit coupled to an array of pixels arranged in rows and columns to receive a first pixel signal and a second pixel signal from a first column and a second column, respectively, and structured to compare each of the first and second pixel signals with a reference voltage and output comparison signals; an analog-digital conversion mode decision circuit located to receive the comparison signals from the comparison circuit and structure to provide a mode decision value which decides an analog-digital conversion mode out of different analog-digital conversion modes based on the comparison signals from the comparison circuit; and a shared circuit shared by the first and second columns, and structured to generate the reference voltage based on the comparison signals from the comparison circuit and the mode decision value from the analog-digital conversion mode decision circuit, the shared circuit outputting the reference voltage to the comparison circuit.

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