Method and system for routing scan chains in an array of processor resources
    2.
    发明授权
    Method and system for routing scan chains in an array of processor resources 失效
    用于在处理器资源阵列中路由扫描链的方法和系统

    公开(公告)号:US07673206B2

    公开(公告)日:2010-03-02

    申请号:US11901184

    申请日:2007-09-14

    Applicant: Richard Conlin

    Inventor: Richard Conlin

    CPC classification number: G06F11/2236 G01R31/318533

    Abstract: The present invention provides a method and system for routing a group of scan chains to a group of processor resources in a semiconductor chip. The group of processor resources is arranged in rows or columns. The group of processor resources in each row or column is connected through a plurality of scan chains. The first processor resource in each row or column is connected to input scan-chain pins, and the last processor resource in each row or column is connected to output scan-chain pins. A test-pattern generator, generating test signals, sends the test signals to the group of processor resources by using the group of scan chains within the semiconductor chip. The responses of the processor resources corresponding to the test signals are analyzed to detect and locate any error in the manufacture of the semiconductor chip.

    Abstract translation: 本发明提供一种用于将一组扫描链路由到半导体芯片中的一组处理器资源的方法和系统。 处理器资源组按行或列排列。 每行或列中的处理器资源组通过多个扫描链连接。 每行或每列中的第一个处理器资源连接到输入扫描链引脚,每行或列中的最后一个处理器资源连接到输出扫描链引脚。 产生测试信号的测试模式发生器通过使用半导体芯片内的扫描链组将测试信号发送到处理器资源组。 分析对应于测试信号的处理器资源的响应,以检测和定位半导体芯片的制造中的任何错误。

    Method and system for routing scan chains in an array of processor resources
    3.
    发明申请
    Method and system for routing scan chains in an array of processor resources 失效
    用于在处理器资源阵列中路由扫描链的方法和系统

    公开(公告)号:US20090077437A1

    公开(公告)日:2009-03-19

    申请号:US11901184

    申请日:2007-09-14

    Applicant: Richard Conlin

    Inventor: Richard Conlin

    CPC classification number: G06F11/2236 G01R31/318533

    Abstract: The present invention provides a method and system for routing a group of scan chains to a group of processor resources in a semiconductor chip. The group of processor resources is arranged in rows or columns. The group of processor resources in each row or column is connected through a plurality of scan chains. The first processor resource in each row or column is connected to input scan-chain pins, and the last processor resource in each row or column is connected to output scan-chain pins. A test-pattern generator, generating test signals, sends the test signals to the group of processor resources by using the group of scan chains within the semiconductor chip. The responses of the processor resources corresponding to the test signals are analyzed to detect and locate any error in the manufacture of the semiconductor chip.

    Abstract translation: 本发明提供一种用于将一组扫描链路由到半导体芯片中的一组处理器资源的方法和系统。 处理器资源组按行或列排列。 每行或列中的处理器资源组通过多个扫描链连接。 每行或每列中的第一个处理器资源连接到输入扫描链引脚,每行或列中的最后一个处理器资源连接到输出扫描链引脚。 产生测试信号的测试模式发生器通过使用半导体芯片内的扫描链组将测试信号发送到处理器资源组。 分析对应于测试信号的处理器资源的响应,以检测和定位半导体芯片的制造中的任何错误。

    Thermal by-pass valve
    6.
    发明申请
    Thermal by-pass valve 有权
    热旁路阀

    公开(公告)号:US20070029398A1

    公开(公告)日:2007-02-08

    申请号:US11197479

    申请日:2005-08-05

    Applicant: Richard Conlin

    Inventor: Richard Conlin

    CPC classification number: F16K31/002 G05D23/022 Y10T137/7737

    Abstract: A thermal by-pass valve for fluids includes a sleeve having an inlet opening, and two outlet openings. One of the outlet openings functions as a by-pass opening. A bi-metallic metal coil is enclosed within the sleeve. The coil has one end securely attached to a cap, which cap incorporates an inlet for a fluid. The cap is attached to the inlet opening of the sleeve. The bi-metallic coil is designed to rotate the sleeve when the temperature of the fluid exceeds or drops below a designated threshold temperature.

    Abstract translation: 用于流体的热旁通阀包括具有入口开口的套筒和两个出口开口。 出口之一作为旁路开口。 双金属线圈封装在套管内。 线圈具有牢固地附接到盖的一端,该盖包括用于流体的入口。 盖子连接到套筒的入口开口。 双金属线圈设计成当流体的温度超过或低于指定的临界温度时旋转套筒。

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