Antimicrobial particle detectors
    1.
    发明授权

    公开(公告)号:US11215546B2

    公开(公告)日:2022-01-04

    申请号:US17063797

    申请日:2020-10-06

    Abstract: The invention generally provides systems and methods for particle detection for minimizing microbial growth and cross-contamination in manufacturing environments requiring low levels of microbes, such as cleanroom environments for electronics manufacturing and aseptic environments for manufacturing pharmaceutical and biological products, such as sterile medicinal products. In some embodiments, systems of the invention incorporate a housing having an outer surface being a first antimicrobial surface and a touchscreen being a second antimicrobial surface. In some embodiments, substantially all of the outer surfaces of the system are antimicrobial surfaces. In some embodiments, the first antimicrobial surface may comprise an Active Screen Plasma alloyed layer. In some embodiments, the housing may comprise a molded polymer substrate and a metal coating layer bonded to the molded polymer substrate such that at least some exterior surfaces of the housing are metal coated surfaces.

    Particle detectors with remote alarm monitoring and control

    公开(公告)号:US11250684B2

    公开(公告)日:2022-02-15

    申请号:US17224599

    申请日:2021-04-07

    Abstract: The invention generally provides devices and methods for particle detection for minimizing human-caused contamination in manufacturing environments requiring low levels of microbes, such as cleanroom environments for electronics manufacturing and aseptic environments for manufacturing pharmaceutical and biological products, such as sterile medicinal products. Methods of the invention may incorporate wirelessly transmitting an alarm signal from a particle detector to a remote device, replicating a graphical user interface of the particle detector on an electronic display of the remote device, and passing one or more user instructions from the remote device to the particle detector via the replicate graphical interface of the remote device.

    Particle detectors with remote alarm monitoring and control

    公开(公告)号:US10997845B2

    公开(公告)日:2021-05-04

    申请号:US17063779

    申请日:2020-10-06

    Abstract: The invention generally provides devices and methods for particle detection for minimizing human-caused contamination in manufacturing environments requiring low levels of microbes, such as cleanroom environments for electronics manufacturing and aseptic environments for manufacturing pharmaceutical and biological products, such as sterile medicinal products. Methods of the invention may incorporate wirelessly transmitting an alarm signal from a particle detector to a remote device, replicating a graphical user interface of the particle detector on an electronic display of the remote device, and passing one or more user instructions from the remote device to the particle detector via the replicate graphical interface of the remote device.

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