Apparatus and methods for electrical switching

    公开(公告)号:US10115894B2

    公开(公告)日:2018-10-30

    申请号:US15388785

    申请日:2016-12-22

    Abstract: Electrical switching technologies employ the otherwise undesirable line defect in crystalline materials to form conductive filaments. A switching cell includes a crystalline layer disposed between an active electrode and another electrode. The crystalline layer has at least one channel, such as a line defect, extending from one surface of the crystalline layer to the other surface. Upon application of a voltage on the two electrodes, the active electrode provides metal ions that can migrate from the active electrode to the other electrode along the line defect, thereby forming a conductive filament. The switching cell can precisely locate the conductive filament within the line defect and increase the device-to-device switching uniformity.

    Confined Growth of 2D Materials and Their Heterostructures

    公开(公告)号:US20240071759A1

    公开(公告)日:2024-02-29

    申请号:US18238853

    申请日:2023-08-28

    Abstract: Two-dimensional (2D) materials and their heterostructures show a promising path for next generation electronics. Nevertheless, there are challenges with (i) controlling monolayer (ML)-by-ML 2D material growth, (ii) maintaining single-domain growth, and (iii) controlling the number of layers and crystallinity at the wafer-scale. The deterministic confined growth techniques disclosed here address these challenges simultaneously to produce wafer-scale single-domain 2D MLs and their heterostructures on arbitrary substrates. The growth of the first nuclei is confined by patterning SiO2 masks on 2-inch substrates to define selective or confined growth areas. Each growth area or trench is just a few microns wide and is filled with a single-domain ML before the second set of nuclei is introduced. Growing the second set of nuclei within the trenches yields an array of single-domain bilayers at the 2-inch wafer scale. Devices made with the single-domain bilayers exhibit excellent performance over the entire wafer.

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