公开(公告)号：US10044451B2

公开(公告)日：2018-08-07

申请号：US14187926

申请日：2014-02-24

Applicant: LITEPOINT CORPORATION

Inventor： Jonathan Barry Hirst ,  Adam Martin Smith

IPC: H04B17/15 ,  H04B17/11

Abstract: Method for testing multiple signal transceiver devices under test (DUTs), such as data packet signal transceivers, with a shared DUT testing resource, such as a tester having a single vector signal generator (VSG) and a single vector signal analyzer (VSA). Requests by the DUTs for access to tester resources (e.g., to receive signals from the signal generator or provide signals to the signal analyzer) are prioritized based upon tester availability and whether the requesting DUT requires sole access or can share access to the tester. If the tester is unavailable, DUT requests are queued according to their respective priorities to await tester availability. As a result, access to shared tester resources can be managed dynamically to minimize test time while testing multiple DUTs concurrently.