Semiconductor memory device and method for testing semiconductor memory device

    公开(公告)号:US10255988B2

    公开(公告)日:2019-04-09

    申请号:US15939443

    申请日:2018-03-29

    Inventor: Shuhei Kamano

    Abstract: A semiconductor memory device includes: a memory cell including a first cell that stores data, and a second cell that stores complementary data that is complementary to the data; a redundant memory cell including a third cell that stores margined complementary data in which a margin is added to the complementary data, and a fourth cell that stores margined data in which a margin is added to the data; and a controller that causes the data and the margined complementary data to be compared and a test of the first cell to be executed, and the complementary data and the margined data to be compared and a test of the second cell to be executed.

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