公开(公告)号：US08693626B2

公开(公告)日：2014-04-08

申请号：US13162762

申请日：2011-06-17

Applicant: Simon Russell Bare ,  Shelly D Kelly ,  Wharton Sinkler ,  Nan Greenlay

Inventor： Simon Russell Bare ,  Shelly D Kelly ,  Wharton Sinkler ,  Nan Greenlay

IPC: G01N23/223 ,  G01T1/36

CPC classification number: G01N23/2206 ,  G01N23/087 ,  G01N23/223 ,  G01N2223/076 ,  G01N2223/203 ,  G01N2223/405 ,  G01N2223/645

Abstract: Methods are disclosed utilizing synchrotron X-ray microscopy including x-ray fluorescence and x-ray absorption spectra to probe elemental distribution and elemental speciation within a material, and particularly a solid that may have one or more elements distributed on a solid substrate. Representative materials are relatively homogeneous in composition on the macroscale but relatively heterogeneous on the microscale. The analysis of such materials, particularly on a macroscale at which their heterogeneous nature can be observed, provides valuable insights into the relationships or correlations between localized concentrations of elements and/or their species, and concentrations of other components of the materials. Sample preparation methods, involving the use of a reinforcing agent, which are advantageously used in such methods are also disclosed.

Abstract translation: 公开利用包括X射线荧光和X射线吸收光谱的同步加速器X射线显微镜以探测材料内的元素分布和元素形态的方法，特别是可以具有分布在固体基底上的一种或多种元素的固体。 代表性材料在宏观尺度上的组成相对均匀，但在微尺度上相对异质。 对这些材料的分析，特别是在可观察其异质性的宏观尺度上，分析了元素和/或其物质的局部浓度和材料的其他成分的浓度之间的关系或相关性的有价值的见解。 还公开了有利地用于这些方法中的使用增强剂的样品制备方法。

公开(公告)号：US20120321039A1

公开(公告)日：2012-12-20

申请号：US13162762

申请日：2011-06-17

Applicant: SIMON RUSSELL BARE ,  SHELLY D. KELLY ,  WHARTON SINKLER ,  NAN GREENLAY

Inventor： SIMON RUSSELL BARE ,  SHELLY D. KELLY ,  WHARTON SINKLER ,  NAN GREENLAY

IPC: G01N23/223 ,  G01T1/36

CPC classification number: G01N23/2206 ,  G01N23/087 ,  G01N23/223 ,  G01N2223/076 ,  G01N2223/203 ,  G01N2223/405 ,  G01N2223/645

Abstract: Methods are disclosed utilizing synchrotron X-ray microscopy including x-ray fluorescence and x-ray absorption spectra to probe elemental distribution and elemental speciation within a material, and particularly a solid that may have one or more elements distributed on a solid substrate. Representative materials are relatively homogeneous in composition on the macroscale but relatively heterogeneous on the microscale. The analysis of such materials, particularly on a macroscale at which their heterogeneous nature can be observed, provides valuable insights into the relationships or correlations between localized concentrations of elements and/or their species, and concentrations of other components of the materials. Sample preparation methods, involving the use of a reinforcing agent, which are advantageously used in such methods are also disclosed.

Abstract translation: 公开利用包括X射线荧光和X射线吸收光谱的同步加速器X射线显微镜以探测材料内的元素分布和元素形态的方法，特别是可以具有分布在固体基底上的一种或多种元素的固体。 代表性材料在宏观尺度上的组成相对均匀，但在微尺度上相对异质。 对这些材料的分析，特别是在可观察其异质性的宏观尺度上，分析了元素和/或其物质的局部浓度和材料的其他成分的浓度之间的关系或相关性的有价值的见解。 还公开了有利地用于这些方法中的使用增强剂的样品制备方法。