Invention Grant
US07808637B2 Method and apparatus for determining liquid crystal cell parameters from full mueller matrix measurements
有权
用于从全μler矩阵测量中确定液晶单元参数的方法和装置
- Patent Title: Method and apparatus for determining liquid crystal cell parameters from full mueller matrix measurements
- Patent Title (中): 用于从全μler矩阵测量中确定液晶单元参数的方法和装置
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Application No.: US11921745Application Date: 2007-12-07
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Publication No.: US07808637B2Publication Date: 2010-10-05
- Inventor: Matthew Smith
- Applicant: Matthew Smith
- Applicant Address: US AL Huntsville
- Assignee: Axometrics, Incorporated
- Current Assignee: Axometrics, Incorporated
- Current Assignee Address: US AL Huntsville
- Agency: Davidson Berquist Jackson & Gowdey LLP
- Main IPC: G01J4/00
- IPC: G01J4/00

Abstract:
Method and apparatus for testing of LCD cells is disclosed. An LCD cell under test (14, 30) may be mounted to translatable table (40) between polarization state generator (10) and polarization state analyzer (16). For each location on cell (14, 30) to be tested, a variety of known polarization states (22) are launched through LCD cell (14, 30) and detected by polarization state analyzer (16). Electrical signals representative of polarization states are acquired by computer (18). Within computer (18), a model (58, 60) of polarization properties of LCD cell (14, 30) is developed based on estimations of what physical parameters of LCD cell (14, 30) are believed to be. RMS differences between simulated polarization properties and measured polarization properties are minimized by iteratively refining (60) modeled physical cell properties, at which point cell thickness and other physical parameters of the LCD cell may be deduced.
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