Invention Grant
US07655904B2 Target workpiece inspection apparatus, image alignment method, and computer-readable recording medium with program recorded thereon
有权
目标工件检查装置,图像对准方法以及记录有程序的计算机可读记录介质
- Patent Title: Target workpiece inspection apparatus, image alignment method, and computer-readable recording medium with program recorded thereon
- Patent Title (中): 目标工件检查装置,图像对准方法以及记录有程序的计算机可读记录介质
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Application No.: US11678748Application Date: 2007-02-26
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Publication No.: US07655904B2Publication Date: 2010-02-02
- Inventor: Kyoji Yamashita
- Applicant: Kyoji Yamashita
- Applicant Address: JP Yokohama-shi
- Assignee: Advanced Mask Inspection Technology Inc.
- Current Assignee: Advanced Mask Inspection Technology Inc.
- Current Assignee Address: JP Yokohama-shi
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2006-217671 20060810
- Main IPC: G01K9/00
- IPC: G01K9/00

Abstract:
A target workpiece inspection apparatus comprises an optical image acquiring unit to acquire an optical image of a target workpiece, a reference image generating unit to generate a reference image to be compared, a difference judging unit to judge whether an absolute value of difference between pixel values of the images in each pixel at a preliminary alignment position between the images is smaller than a threshold value, a least-squares method displacement calculating unit to calculate a displacement amount displaced from the preliminary alignment position, by using a regular matrix for a least-squares method obtained from a result judged, a position correcting unit to correct an alignment position between the optical image and the reference image to a position displaced from the preliminary alignment position by the displacement amount, and a comparing unit to compare the optical image and the reference image whose alignment position has been corrected.
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