Invention Grant
- Patent Title: Workpiece inspection apparatus, workpiece inspection method and computer-readable recording medium storing program
- Patent Title (中): 工件检查装置,工件检查方法和计算机可读记录介质存储程序
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Application No.: US11299847Application Date: 2005-12-13
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Publication No.: US07643668B2Publication Date: 2010-01-05
- Inventor: Yuichi Nakatani
- Applicant: Yuichi Nakatani
- Applicant Address: JP Kawasaki-shi
- Assignee: Advanced Mask Inspection Technology Inc.
- Current Assignee: Advanced Mask Inspection Technology Inc.
- Current Assignee Address: JP Kawasaki-shi
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2005-277774 20050926
- Main IPC: G06K9/62
- IPC: G06K9/62 ; G06K9/00 ; G06K9/38

Abstract:
A workpiece inspection apparatus includes a search unit for finding from an input reference image a first pixel group which contains a certain pixel and a second pixel group having grayscale values within a threshold, and a probability acquisition unit responsive to receipt of an optical image of a workpiece being tested and the reference image, for obtaining a probability value based on a grayscale value of the certain pixel, a grayscale value of its corresponding pixel in the second pixel group, a grayscale value of an optical image pixel corresponding to the certain pixel, and a grayscale value of an optical image pixel corresponding to a pixel in the second pixel group corresponding to the certain pixel. The probability value is used to determine whether a defect exists at the optical image pixel corresponding to the certain pixel.
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