Invention Grant
- Patent Title: Method of detecting a circuit malfunction and related device
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Application No.: US16808324Application Date: 2020-03-03
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Publication No.: US10909290B2Publication Date: 2021-02-02
- Inventor: I-Hsiu Lo , Yung-Jen Chen , Yu-Lan Lo , Shu-Yi Kao
- Applicant: Realtek Semiconductor Corp.
- Applicant Address: TW HsinChu
- Assignee: Realtek Semiconductor Corp.
- Current Assignee: Realtek Semiconductor Corp.
- Current Assignee Address: TW HsinChu
- Agent Winston Hsu
- Priority: TW108112082A 20190408
- Main IPC: G06F17/50
- IPC: G06F17/50 ; G06F30/3323 ; G06F30/3308 ; G06F30/398

Abstract:
A method of detecting a circuit malfunction in a register transfer level, RTL, design stage is disclosed. The method comprises obtaining signal points of each register from a circuit model based on the RTL design stage, generating a property list according to the signal points of each register, wherein the property list includes a property to be verified for each signal point, performing a formal verification operation according to the circuit model and the property list, to determine whether the property of the property list for each signal point in the circuit model is true, and generating a circuit malfunction result according to the signal point whose property is not true.
Public/Granted literature
- US20200320241A1 Method of Detecting a Circuit Malfunction and Related Device Public/Granted day:2020-10-08
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