Invention Grant
- Patent Title: Detection methods for NOR flash memory
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Application No.: US15913451Application Date: 2018-03-06
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Publication No.: US10566072B2Publication Date: 2020-02-18
- Inventor: Koying Huang
- Applicant: Winbond Electronics Corp.
- Applicant Address: TW Taichung
- Assignee: WINBOND ELECTRONICS CORP.
- Current Assignee: WINBOND ELECTRONICS CORP.
- Current Assignee Address: TW Taichung
- Agency: Muncy, Geissler, Olds & Lowe, P.C.
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G11C29/02 ; G11C29/44 ; G11C29/50 ; H01L27/115 ; G11C29/12

Abstract:
A method for detecting a flash memory array includes a plurality of word lines, a plurality of bit lines, and a source line, includes executing a first detection process. The first detection process includes: applying a first positive voltage to a P-type well of the flash memory array; applying a ground to all the word lines; floating the bit lines and the source line; determining whether a leakage current flowing through the P-type well exceeds a leakage threshold; and when the leakage current exceeds the leakage threshold, determining that at least one of the word lines is short-circuited with at least one of the bit lines or the source line.
Public/Granted literature
- US20190279732A1 DETECTION METHODS FOR NOR FLASH MEMORY Public/Granted day:2019-09-12
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