Invention Grant
- Patent Title: Sample analyzer and method for controlling a sample analyzer
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Application No.: US13853619Application Date: 2013-03-29
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Publication No.: US09989469B2Publication Date: 2018-06-05
- Inventor: Masakazu Fukuda , Masamichi Tanaka , Rumi Takata
- Applicant: SYSMEX CORPORATION
- Applicant Address: JP Kobe-shi
- Assignee: SYSMEX CORPORATION
- Current Assignee: SYSMEX CORPORATION
- Current Assignee Address: JP Kobe-shi
- Agency: Metrolexis Law Group, PLLC
- Priority: JP2012-079927 20120330
- Main IPC: G01N35/10
- IPC: G01N35/10 ; G01N21/64 ; G01N35/00

Abstract:
Disclosed is a sample analyzer comprising: a sample measuring section including a detecting section for detecting a component contained in a sample and a flow path for feeding the sample to the detecting section; and a control section. The control section is programmed to automatically control the sample measuring section to flow a sample blank free of particles to the detecting section and detect a component contained in the sample blank to check a background of the detection after the sample measuring section performs washing of the flow path.
Public/Granted literature
- US20130260415A1 SAMPLE ANALYZER AND METHOD FOR CONTROLLING A SAMPLE ANALYZER Public/Granted day:2013-10-03
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