Invention Grant
- Patent Title: Time delay integration image sensor with detection of travelling errors
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Application No.: US14765362Application Date: 2014-02-06
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Publication No.: US09967490B2Publication Date: 2018-05-08
- Inventor: Frédéric Mayer , Bertrand De Monte
- Applicant: E2V SEMICONDUCTORS
- Applicant Address: FR Saint Egreve
- Assignee: E2V SEMICONDUCTORS
- Current Assignee: E2V SEMICONDUCTORS
- Current Assignee Address: FR Saint Egreve
- Agency: Hauptman Ham, LLP
- Priority: FR1351036 20130207
- International Application: PCT/EP2014/052294 WO 20140206
- International Announcement: WO2014/122198 WO 20140814
- Main IPC: H04N5/335
- IPC: H04N5/335 ; H04N5/217 ; H04N5/372 ; H04N5/374 ; H04N5/232

Abstract:
The invention relates to time delay integration (TDI) image sensors. The sensor includes means for detecting a shift of the sensor with respect to the image. The pixel matrix is divided in the column direction into at least a first and a second sub-matrix (Ma, Mb). On each side of each sub-matrix are arranged groups of additional columns (GRa1, GRb1, GRa2, GRb2). The shifts (Db2−Da2, Db3−Da3, etc.) in relative position of these groups between the first and the second sub-matrices are different from each other and make it possible to detect a relative shift of the sensor during travel. More precisely, the signals originating from groups of columns of same rank associated with the two sub-matrices are compared. The pair of groups that delivers the pair of signals that are closest to each other defines the probable shift of the sensor with respect to the image: this shift is equal to the relative position difference of these two groups.
Public/Granted literature
- US20150365619A1 TIME DELAY INTEGRATION IMAGE SENSOR WITH DETECTION OF TRAVELLING ERRORS Public/Granted day:2015-12-17
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