- Patent Title: Reduced substrate effects in monolithically integrated RF circuits
-
Application No.: US15193598Application Date: 2016-06-27
-
Publication No.: US09966301B2Publication Date: 2018-05-08
- Inventor: David J. Howard , Michael J. DeBar , Paul D. Hurwitz
- Applicant: Newport Fab, LLC
- Applicant Address: US CA Newport Beach
- Assignee: New Fab, LLC
- Current Assignee: New Fab, LLC
- Current Assignee Address: US CA Newport Beach
- Agency: Farjami & Farjami LLP
- Main IPC: H01L21/30
- IPC: H01L21/30 ; H01L21/46 ; H01L21/00 ; H01L21/762 ; H01L21/304 ; H01L21/306 ; H01L23/367 ; H01L23/373 ; H01L21/84

Abstract:
A method of forming a semiconductor structure is disclosed. The method includes forming a semiconductor wafer having a device layer situated over a handle substrate, the device layer having at least one semiconductor device, forming a front side glass on a front side of the semiconductor wafer, and partially removing the handle substrate from a back side of the semiconductor wafer. The method also includes removing a portion of the semiconductor wafer from an outer perimeter thereof, either by sawing an edge trim trench through the handle substrate, the device layer and into the front side glass to form a ring, and removing the ring on the outer perimeter of the semiconductor wafer, or by edge grinding the outer perimeter of the semiconductor wafer. The method further includes completely removing the handle substrate.
Public/Granted literature
- US20170372945A1 Reduced Substrate Effects in Monolithically Integrated RF Circuits Public/Granted day:2017-12-28
Information query
IPC分类: