Invention Grant
- Patent Title: Plasma processing apparatus
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Application No.: US14382898Application Date: 2013-04-04
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Publication No.: US09966233B2Publication Date: 2018-05-08
- Inventor: Hidetoshi Hanaoka
- Applicant: Tokyo Electron Limited
- Applicant Address: JP Tokyo
- Assignee: TOKYO ELECTRON LIMITED
- Current Assignee: TOKYO ELECTRON LIMITED
- Current Assignee Address: JP Tokyo
- Agency: Pearne & Gordon LLP
- Priority: JP2012-086180 20120405
- International Application: PCT/JP2013/060304 WO 20130404
- International Announcement: WO2013/151124 WO 20131010
- Main IPC: C23C16/00
- IPC: C23C16/00 ; H01L21/00 ; H01J37/32 ; H01L21/311

Abstract:
A plasma processing apparatus of exciting a processing gas into plasma by applying a high frequency power between an upper electrode and a lower electrode provided within a processing chamber and performing a plasma process on a target object to be processed with the plasma includes a DC power supply configured to apply a DC voltage to the upper electrode; a ground electrode connected to the DC power supply; and an annular shield member provided outside the ground electrode. A groove is formed into a downward recess at an outer peripheral portion of the ground electrode, and an upper end of the shield member is positioned above an upper end of the peripheral portion of the ground electrode. A protruding portion, which is protruded toward a center of the ground electrode, is formed at a portion of the shield member positioned above the ground electrode.
Public/Granted literature
- US20150027635A1 PLASMA PROCESSING APPARATUS Public/Granted day:2015-01-29
Information query
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