Invention Grant
- Patent Title: Quantitative secondary electron detection
-
Application No.: US14918560Application Date: 2015-10-20
-
Publication No.: US09966224B2Publication Date: 2018-05-08
- Inventor: Jyoti Agrawal , David C. Joy , Subuhadarshi Nayak
- Applicant: ScienceTomorrow LLC
- Main IPC: H01J37/244
- IPC: H01J37/244 ; H01J37/285 ; H01J37/28

Abstract:
Quantitative Secondary Electron Detection (QSED) using the array of solid state devices (SSD) based electron-counters enable critical dimension metrology measurements in materials such as semiconductors, nanomaterials, and biological samples (FIG. 3). Methods and devices effect a quantitative detection of secondary electrons with the array of solid state detectors comprising a number of solid state detectors. An array senses the number of secondary electrons with a plurality of solid state detectors, counting the number of secondary electrons with a time to digital converter circuit in counter mode.
Public/Granted literature
- US20160148780A1 QUANTITATIVE SECONDARY ELECTRON DETECTION Public/Granted day:2016-05-26
Information query