Invention Grant
- Patent Title: Double data rate decoding device with edge-triggered shifting latch stages
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Application No.: US15097721Application Date: 2016-04-13
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Publication No.: US09966117B2Publication Date: 2018-05-08
- Inventor: Won-Seok Hwang
- Applicant: SK hynix Inc.
- Applicant Address: KR Gyeonggi-do
- Assignee: SK Hynix Inc.
- Current Assignee: SK Hynix Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T Group LLP
- Priority: KR10-2015-0156608 20151109
- Main IPC: G11C7/10
- IPC: G11C7/10 ; G11C8/18 ; G11C19/28 ; H03K3/356 ; H03K3/037

Abstract:
Disclosed are a latch circuit receiving a negative output of a next latch stage circuit as a feedback input, a double data rate (DDR) ring counter based on the latch circuit to perform DDR counting of pulse periods and reduce the number of toggles, a hybrid counting device counting lower-bit portion by using the latch-based DDR ring counter and upper-bit portion by using a binary counter, and an analog-to-digital converting device and a CMOS image sensor employing the hybrid counting device. A double data rate ring counter may include a plurality of latches coupled in a form of a ring. The plurality of latches may include positive-edge-triggered latches and negative-edge-triggered latches arranged alternately. A current latch stage receives an output of a preceding latch stage to shift to a next latch stage according to a counter clock, receives an output of the next latch stage to check a data shift to the next latch stage, and falls to a low level if the data shift is checked.
Public/Granted literature
- US20170133065A1 LATCH CIRCUIT AND DOUBLE DATA RATE DECODING DEVICE BASED ON THE SAME Public/Granted day:2017-05-11
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