Invention Grant
- Patent Title: Apparatus and method for measuring surface tension
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Application No.: US14367321Application Date: 2011-12-31
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Publication No.: US09964479B2Publication Date: 2018-05-08
- Inventor: Junghoon Lee , Yongjoo Kwon , Seungyul Choi
- Applicant: Junghoon Lee , Yongjoo Kwon , Seungyul Choi
- Applicant Address: KR Seoul
- Assignee: SEOUL NATIONAL UNIVERSITY R&D FOUNDATION
- Current Assignee: SEOUL NATIONAL UNIVERSITY R&D FOUNDATION
- Current Assignee Address: KR Seoul
- Priority: KR10-2011-0147980 20111231
- International Application: PCT/KR2011/010412 WO 20111231
- International Announcement: WO2013/100244 WO 20130704
- Main IPC: G01N13/02
- IPC: G01N13/02 ; G01N27/22
Abstract:
The present invention relates to an apparatus and method for measuring surface tension. More particularly, the present invention relates an apparatus and method for measuring surface tension through an electrical scheme which is simpler and has improved accuracy compared to a conventional optical scheme.
Public/Granted literature
- US20150233810A1 APPARATUS AND METHOD FOR MEASURING SURFACE TENSION Public/Granted day:2015-08-20
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