Invention Grant
- Patent Title: Destructive inspection method and quality determination method for vitreous silica crucible
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Application No.: US15512535Application Date: 2015-09-24
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Publication No.: US09964478B2Publication Date: 2018-05-08
- Inventor: Ken Kitahara , Tadahiro Sato , Toshiaki Sudo , Eriko Kitahara , Takashi Watanabe
- Applicant: SUMCO CORPORATION
- Applicant Address: JP Tokyo
- Assignee: SUMCO CORPORATION
- Current Assignee: SUMCO CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Law Office of Katsuhiro Arai
- Priority: JP2014-192923 20140922
- International Application: PCT/JP2015/076951 WO 20150924
- International Announcement: WO2016/047694 WO 20160331
- Main IPC: G01N19/08
- IPC: G01N19/08 ; G01N3/307 ; C30B29/06 ; C30B15/10 ; C03B19/09

Abstract:
A destructive inspection method of a vitreous silica crucible for pulling a silicon single crystal evaluates a crack state of an inner surface of the vitreous silica crucible supported by a graphite susceptor when a load is instantaneously applied to at least one point on the inner surface via an automatic center punch while pushing the tip portion of the automatic center punch against the inner surface. The destructive inspection method can inspect the vitreous silica crucible under conditions as close to the actual conditions of use as possible.
Public/Granted literature
- US20170292901A1 DESTRUCTIVE INSPECTION METHOD AND QUALITY DETERMINATION METHOD FOR VITREOUS SILICA CRUCIBLE Public/Granted day:2017-10-12
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