Invention Grant
- Patent Title: Charged-particle detector and method of controlling the same
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Application No.: US15232066Application Date: 2016-08-09
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Publication No.: US09934952B2Publication Date: 2018-04-03
- Inventor: Masahiro Hayashi
- Applicant: HAMAMATSU PHOTONICS K.K.
- Applicant Address: JP Hamamatsu-shi, Shizuoka
- Assignee: HAMAMATSU PHOTONICS K.K.
- Current Assignee: HAMAMATSU PHOTONICS K.K.
- Current Assignee Address: JP Hamamatsu-shi, Shizuoka
- Agency: Drinker Biddle & Reath LLP
- Priority: JP2015-158293 20150810
- Main IPC: H01J49/02
- IPC: H01J49/02 ; H01J49/26 ; H01J43/24

Abstract:
The present embodiment relates to a charged-particle detector, etc. provided with a structure for effectively suppressing ion feedbacks under a low-vacuum environment. In order to capture the residual-gas ions, which are generated by collisions between the electrons output from a MCP unit 200 and residual-gas molecules, by a second electrode 400, which is electrically insulated from a first electrode 300, which is mainly for capturing electrons, the potential of the first electrode 300 is set to be higher than an output-side potential of the MCP unit 200, and, on the other hand, the potential of the second electrode 400 is set to be lower than the output-side potential of the MCP unit 200. As a result, the ion feedbacks to the MCP unit 200 are effectively suppressed.
Public/Granted literature
- US20170047213A1 CHARGED-PARTICLE DETECTOR AND METHOD OF CONTROLLING THE SAME Public/Granted day:2017-02-16
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