Invention Grant
- Patent Title: Control device, charged particle beam apparatus, program and method for producing processed product
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Application No.: US15468657Application Date: 2017-03-24
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Publication No.: US09934940B2Publication Date: 2018-04-03
- Inventor: Satoshi Tomimatsu , Tsuyoshi Oonishi , Hiroki Kawada , Hideo Sakai
- Applicant: HITACHI HIGH-TECH SCIENCE CORPORATION
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Tech Science Corporation
- Current Assignee: Hitachi High-Tech Science Corporation
- Current Assignee Address: JP Tokyo
- Agency: Senniger Powers LLP
- Priority: JP2016-062280 20160325
- Main IPC: H01J37/00
- IPC: H01J37/00 ; H01J37/302 ; H01J37/317

Abstract:
There is provided a control device for controlling a charged particle beam apparatus, wherein the beam apparatus comprises a workpiece stage having at least two turning axes which are not parallel to each other and an irradiation unit, and the control device comprises an angle calculation unit that based on a direction of a first processing in which a processed surface having a normal line not parallel to any of the turning axes is generated in the workpiece by the irradiation unit and a direction of a second processing to be processed by the irradiation unit from a direction different from the direction of the first processing with respect to the processed surface to be generated by the first processing, calculates turning angles about the turning axes that changes the direction of the stage from the direction of the first processing to the direction of the second processing.
Public/Granted literature
- US20170278673A1 CONTROL DEVICE, CHARGED PARTICLE BEAM APPARATUS, PROGRAM AND METHOD FOR PRODUCING PROCESSED PRODUCT Public/Granted day:2017-09-28
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