Invention Grant
- Patent Title: Methods for determining the resistive states of resistive change elements
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Application No.: US15175234Application Date: 2016-06-07
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Publication No.: US09934848B2Publication Date: 2018-04-03
- Inventor: Qawi Harvard
- Applicant: Nantero, Inc.
- Applicant Address: US MA Woburn
- Assignee: Nantero, Inc.
- Current Assignee: Nantero, Inc.
- Current Assignee Address: US MA Woburn
- Agency: Nantero, Inc.
- Main IPC: G11C13/00
- IPC: G11C13/00 ; H01L51/05

Abstract:
Devices and methods for determining resistive states of resistive change elements in resistive change element arrays are disclosed. According to some aspects of the present disclosure the devices and methods for determining resistive states of resistive change elements can determine resistive states of resistive change elements by sensing current flow. According to some aspects of the present disclosure the devices and methods for determining resistive states of resistive change elements can determine resistive states of resistive change elements without the need for in situ selection devices or other current controlling devices. According to some aspects of the present disclosure the devices and methods for determining resistive states of resistive change elements can reduce the impact of sneak current when determining resistive states of resistive change elements.
Public/Granted literature
- US20170352415A1 METHODS FOR DETERMINING THE RESISTIVE STATES OF RESISTIVE CHANGE ELEMENTS Public/Granted day:2017-12-07
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