Invention Grant
- Patent Title: Apparatuses and methods for detecting frequency ranges corresponding to signal delays of conductive VIAS
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Application No.: US15635071Application Date: 2017-06-27
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Publication No.: US09934832B2Publication Date: 2018-04-03
- Inventor: Tomoyuki Shibata , Minehiko Uehara
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dorsey & Whitney LLP
- Main IPC: H03B19/00
- IPC: H03B19/00 ; G11C7/22 ; H01L25/065 ; H03K5/26 ; H03K5/13 ; H03K5/156 ; G11C5/06 ; G11C8/18

Abstract:
Apparatuses for monitoring a signal on a conductive via are described. An example apparatus includes: a controller, a first conductive via, a second conductive via and an evaluation circuit. The controller provides a clock signal as a first signal. The first conductive via provides a second signal responsive to the first signal. The second conductive via provides a third signal responsive to the second signal. Responsive to the third signal, the evaluation circuit provides an evaluation result signal. The evaluation result signal is indicative of a frequency of the clock signal, based on a delay of the third signal relative to the clock signal. The first conductive via, the second conductive via and the evaluation circuit may be included in an interface die. The evaluation circuit may detect whether a frequency of the first signal is below a first threshold frequency and may further provide the evaluation result signal.
Public/Granted literature
- US20170309319A1 APPARATUSES AND METHODS FOR DETECTING FREQUENCY RANGES CORRESPONDING TO SIGNAL DELAYS OF CONDUCTIVE VIAS Public/Granted day:2017-10-26
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