Invention Grant
- Patent Title: Apparatuses and methods for selective determination of data error repair
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Application No.: US15174462Application Date: 2016-06-06
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Publication No.: US09934086B2Publication Date: 2018-04-03
- Inventor: Ryan S. Laity , Christopher S. Johnson
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Brooks, Cameron & Huebsch, PLLC
- Main IPC: G06F11/10
- IPC: G06F11/10 ; G11C29/52

Abstract:
Apparatuses and methods are described for selective determination of data error repair. An example apparatus includes a memory array and a controller coupled to the memory array. The controller is configured to direct performance, responsive to a request, of a read operation at an address in the memory array, direct detection of an error in data corresponding to the read operation address, and direct storage of the read operation address in an address error register. The controller is further configured to direct a response be sent to the enable selective determination of data error repair, where the response does not include the read operation address.
Public/Granted literature
- US20170351570A1 APPARATUSES AND METHODS FOR SELECTIVE DETERMINATION OF DATA ERROR REPAIR Public/Granted day:2017-12-07
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