Invention Grant
- Patent Title: Voltage detection circuit
-
Application No.: US14656163Application Date: 2015-03-12
-
Publication No.: US09933494B2Publication Date: 2018-04-03
- Inventor: Makoto Mitani , Kotaro Watanabe
- Applicant: Seiko Instruments Inc.
- Applicant Address: JP Chiba
- Assignee: SII SEMICONDUCTOR CORPORATION
- Current Assignee: SII SEMICONDUCTOR CORPORATION
- Current Assignee Address: JP Chiba
- Agency: Brinks Gilson & Lione
- Priority: JP2014-050434 20140313
- Main IPC: G01R31/40
- IPC: G01R31/40 ; G01R19/00

Abstract:
To provide a voltage detection circuit in which the influence on a detection voltage by semiconductor manufacturing variations is small and which is small in current consumption. A voltage detection circuit is provided which detects a voltage, based on an output signal of a detection circuit and outputs a detection signal. The detection circuit includes a first MOS transistor unit which allows a first current to flow, a second MOS transistor unit which allows a second current to flow, and a current voltage conversion unit which converts each of the first current and the second current into a voltage and outputs the same as the detection signal. A voltage characteristic of the first current and a voltage characteristic of the second current are configured so as to be crossed with each other at a predetermined voltage.
Public/Granted literature
- US20150260802A1 VOLTAGE DETECTION CIRCUIT Public/Granted day:2015-09-17
Information query