Invention Grant
- Patent Title: Thermal flow meter
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Application No.: US15653360Application Date: 2017-07-18
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Publication No.: US09933292B2Publication Date: 2018-04-03
- Inventor: Shinobu Tashiro , Keiji Hanzawa , Noboru Tokuyasu , Takeshi Morino , Ryosuke Doi , Akira Uenodan
- Applicant: Hitachi Automotive Systems, Ltd.
- Applicant Address: JP Hitachinaka-shi
- Assignee: Hitachi Automotive Systems, Ltd.
- Current Assignee: Hitachi Automotive Systems, Ltd.
- Current Assignee Address: JP Hitachinaka-shi
- Agency: Crowell & Moring LLP
- Priority: JP2012-135304 20120615
- Main IPC: G01F1/684
- IPC: G01F1/684 ; G01F15/18 ; F02D41/18 ; G01F1/696 ; G01F1/698 ; G01F1/699 ; G01F5/00 ; G01F15/00 ; G01F15/02 ; G01F15/04 ; G01F15/14

Abstract:
The present invention provides a thermal flow meter 300 which reduces a stress applied from a fixing portion 3721, which is used to hold and fix a circuit package 400 with respect to a housing 302, to the circuit package 400 and has high reliability. In the thermal flow meter of the invention, the circuit package 400 embedded with a flow rate measurement circuit is formed through a first resin molding process, the fixing portion 3721 is formed along with the housing 302 through a second resin molding process, and the circuit package 400 is enveloped by the fixing portion 3721, whereby the circuit package 400 is held by and fixed to the housing 302. In order to reduce the influence of a stress, generated based on a temperature change of the fixing portion 3721, on the circuit package 400, the fixing portion 3721 is constituted of a thick portion 4714 and a thin portion 4710. Since thickness of a resin of the thin portion 4710 is small, the stress to be generated is small, and a force applied to the circuit package 400 can be reduced.
Public/Granted literature
- US20180017422A1 Thermal Flow Meter Public/Granted day:2018-01-18
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