Invention Grant
- Patent Title: Metal-assisted etch combined with regularizing etch
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Application No.: US14917698Application Date: 2014-08-27
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Publication No.: US09911878B2Publication Date: 2018-03-06
- Inventor: Joanne Yim , Jeff Miller , Michael Jura , Marcie R. Black , Joanne Forziati , Brian Murphy , Lauren Magliozzi
- Applicant: Advanced Silicon Group, Inc.
- Applicant Address: US MA Lincoln
- Assignee: Advanced Silicon Group, Inc.
- Current Assignee: Advanced Silicon Group, Inc.
- Current Assignee Address: US MA Lincoln
- Agency: Lando & Anastasi, LLP
- International Application: PCT/US2014/053000 WO 20140827
- International Announcement: WO2015/038340 WO 20150319
- Main IPC: H01L31/0236
- IPC: H01L31/0236 ; H01L31/18 ; B82Y40/00 ; H01L21/306

Abstract:
In an aspect of the disclosure, a process for forming nanostructuring on a silicon-containing substrate is provided. The process comprises (a) performing metal-assisted chemical etching on the substrate, (b) performing a clean, including partial or total removal of the metal used to assist the chemical etch, and (c) performing an isotropic or substantially isotropic chemical etch subsequently to the metal-assisted chemical etch of step (a). In an alternative aspect of the disclosure, the process comprises (a) performing metal-assisted chemical etching on the substrate, (b) cleaning the substrate, including removal of some or all of the assisting metal, and (c) performing a chemical etch which results in regularized openings in the silicon substrate.
Public/Granted literature
- US20160218229A1 METAL-ASSISTED ETCH COMBINED WITH REGULARIZING ETCH Public/Granted day:2016-07-28
Information query
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