- Patent Title: Semiconductor memory device and writing operation method thereof
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Application No.: US15588560Application Date: 2017-05-05
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Publication No.: US09911498B2Publication Date: 2018-03-06
- Inventor: Masanobu Shirakawa , Kenta Yasufuku , Akira Yamaga
- Applicant: Toshiba Memory Corporation
- Applicant Address: JP Tokyo
- Assignee: TOSHIBA MEMORY CORPORATION
- Current Assignee: TOSHIBA MEMORY CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Patterson & Sheridan, LLP
- Priority: JP2015-179942 20150911
- Main IPC: G11C16/04
- IPC: G11C16/04 ; G11C16/10 ; G11C11/56 ; G11C16/08 ; G11C16/34 ; G11C16/26

Abstract:
A memory system includes a semiconductor memory device having memory cells arranged in rows and columns, and a controller configured to issue a write command with or without a partial page program command to the semiconductor memory device. The semiconductor memory device, in response to the write command issued without the partial page command, executes a first program operation on a page of memory cells and then a first verify operation on the memory cells of the page using a first verify voltage for all of the memory cells of the page, and in response to the write command issued with the partial page command, executes a second program operation on a subset of the memory cells of the page and then a second verify operation on the memory cells of the subset using one of several different second verify voltages corresponding to the subset.
Public/Granted literature
- US20170243657A1 MEMORY SYSTEM Public/Granted day:2017-08-24
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