- Patent Title: Method and system to calibrate phase supported by factory trim data
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Application No.: US15225782Application Date: 2016-08-01
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Publication No.: US09887832B1Publication Date: 2018-02-06
- Inventor: Gernot Hueber , Ian Thomas Macnamara
- Applicant: NXP B.V.
- Applicant Address: NL Eindhoven
- Assignee: NXP B.V.
- Current Assignee: NXP B.V.
- Current Assignee Address: NL Eindhoven
- Main IPC: H03H7/40
- IPC: H03H7/40 ; H04L7/04 ; H04W4/00 ; H04B17/318 ; H04L12/741
Abstract:
The present invention provides for a method and system to compensate phase offset caused by the IC (integrated circuit) by making use of factory measurement stored as trim-data in the IC. In the final customer product, the trim-data is mapped to the actual platform environment such that the respective phase offset can be compensated.
Public/Granted literature
- US20180034622A1 METHOD AND SYSTEM TO CALIBRATE PHASE SUPPORTED BY FACTORY TRIM DATA Public/Granted day:2018-02-01
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