Invention Grant
- Patent Title: Measuring device for property of photovoltaic device and measuring method using the same
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Application No.: US14965893Application Date: 2015-12-10
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Publication No.: US09866171B2Publication Date: 2018-01-09
- Inventor: Yean-San Long , Shu-Tsung Hsu , Teng-Chun Wu , Min-An Tsai
- Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- Applicant Address: TW Hsinchu
- Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- Current Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- Current Assignee Address: TW Hsinchu
- Agency: Rabin & Berdo, P.C.
- Priority: TW104133486A 20151013; CN201510756004 20151109
- Main IPC: G01R31/00
- IPC: G01R31/00 ; H02S50/15
Abstract:
A measuring device for the property of a photovoltaic device and a measuring method using the same are provided. The measuring device includes several light sources and a feedback control module. The light color of each light source is different and includes several light-emitting elements symmetrically configured. The feedback control module is used for controlling illuminations of the light-emitting elements for measuring the property of a photovoltaic device.
Public/Granted literature
- US20170104448A1 MEASURING DEVICE FOR PROPERTY OF PHOTOVOLTAIC DEVICE AND MEASURING METHOD USING THE SAME Public/Granted day:2017-04-13
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