Invention Grant
- Patent Title: Semiconductor device
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Application No.: US15177827Application Date: 2016-06-09
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Publication No.: US09754863B2Publication Date: 2017-09-05
- Inventor: Sota Watanabe , Hiroaki Furihata , Makoto Imai
- Applicant: FUJI ELECTRIC CO., LTD.
- Applicant Address: JP Kawasaki-Shi
- Assignee: FUJI ELECTRIC CO., LTD.
- Current Assignee: FUJI ELECTRIC CO., LTD.
- Current Assignee Address: JP Kawasaki-Shi
- Agent Manabu Kanesaka
- Priority: JP2015-119233 20150612
- Main IPC: H01L23/495
- IPC: H01L23/495 ; H05K7/10 ; H01L21/00 ; H01L23/31 ; H01L29/739 ; H01L29/78 ; H01L29/861 ; H01L27/082 ; H01L27/088 ; H01L27/08 ; H01L23/49

Abstract:
The semiconductor device improves heat dissipation by loading a diode and a MOSFET or IGBT in a single package. A drain electrode disposed on a rear surface of a MOSFET chip is soldered to an upper surface of a first lead frame, and a cathode electrode disposed on a rear surface of a diode chip is soldered to an upper surface of a second lead frame. Rear surfaces of the first lead frame and second lead frame to which neither the diode chip nor the MOSFET chip is connected are disposed so as to be exposed from a sealing resin.
Public/Granted literature
- US20160365303A1 SEMICONDUCTOR DEVICE Public/Granted day:2016-12-15
Information query
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