Invention Grant
- Patent Title: Test device and method for controlling the same
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Application No.: US14751726Application Date: 2015-06-26
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Publication No.: US09753819B2Publication Date: 2017-09-05
- Inventor: Im Ho Shin , Ki Ju Lee , Jung Tae Lee
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2014-0156296 20141111
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/14 ; G01N35/00

Abstract:
A test device and a method for controlling the test device are disclosed. After a test is interrupted due to a malfunction of the test device, the test device continuously performs the interrupted testing. The test device for testing a biological material includes: a memory configured to store information which relates to progress of a test; and a controller which, if the test is interrupted due to a malfunction of the test device, is configured to continue performance of the test by using the information which relates to the test progress which is stored in the memory.
Public/Granted literature
- US20160132402A1 TEST DEVICE AND METHOD FOR CONTROLLING THE SAME Public/Granted day:2016-05-12
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