Invention Grant
- Patent Title: Method for testing a multi-chip system or a single chip and system thereof
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Application No.: US14384172Application Date: 2012-05-10
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Publication No.: US09753087B2Publication Date: 2017-09-05
- Inventor: Gan Wen
- Applicant: Gan Wen
- Applicant Address: SE Stockholm
- Assignee: Telefonaktiebolaget LM Ericsson (publ)
- Current Assignee: Telefonaktiebolaget LM Ericsson (publ)
- Current Assignee Address: SE Stockholm
- Agency: Baker Botts, LLP
- International Application: PCT/CN2012/075289 WO 20120510
- International Announcement: WO2013/166685 WO 20131114
- Main IPC: G01R31/26
- IPC: G01R31/26 ; G01R31/319 ; G01R31/3185 ; G01R31/317 ; G01R31/28
Abstract:
A method for testing a multi-chip system with multiple ports includes determining a test path formed by connecting the multiple ports. The test path is determined in such a way that the internal logic circuit of each chip in the multi-chip system is bypassed. The method further includes injecting a test traffic to the test path, and receiving the test traffic from the test path.
Public/Granted literature
- US20150048855A1 METHOD FOR TESTING A MULTI-CHIP SYSTEM OR A SINGLE CHIP AND SYSTEM THEREOF Public/Granted day:2015-02-19
Information query
