Invention Grant
- Patent Title: Sample test automation system
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Application No.: US13699646Application Date: 2011-05-23
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Publication No.: US09753048B2Publication Date: 2017-09-05
- Inventor: Takahiro Sasaki , Kenichi Takahashi , Hiroshi Ohga , Tatsuya Fukugaki , Shigeru Yano , Kenichi Yasuzawa , Nozomi Hasegawa , Masaaki Hanawa
- Applicant: Takahiro Sasaki , Kenichi Takahashi , Hiroshi Ohga , Tatsuya Fukugaki , Shigeru Yano , Kenichi Yasuzawa , Nozomi Hasegawa , Masaaki Hanawa
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2010-118028 20100524; JP2010-159260 20100714; JP2010-162407 20100720
- International Application: PCT/JP2011/061759 WO 20110523
- International Announcement: WO2011/148897 WO 20111201
- Main IPC: G01N1/22
- IPC: G01N1/22 ; G01N35/02 ; G01N35/00

Abstract:
A sample test automation system which is capable of reducing the workload of an operator and precisely carrying out necessary processes of each of samples without stagnation. In the sample test automation system, a sample tray 120 on which a plurality of samples 150 can be installed is prepared, an identifier for distinguishing the sample tray 120 is attached to the sample tray 120, a sample introducing unit 10 is provided with an identifier reading apparatus 111 which reads the identifier of the sample tray 120, and information about the samples 150 is switched based on the read identifier of the sample tray 120.
Public/Granted literature
- US20130061693A1 SAMPLE TEST AUTOMATION SYSTEM Public/Granted day:2013-03-14
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