Invention Grant
- Patent Title: Glitch detection and method for detecting a glitch
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Application No.: US14811536Application Date: 2015-07-28
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Publication No.: US09729988B2Publication Date: 2017-08-08
- Inventor: Michael Kropfitsch , Jose Luis Ceballos
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Slater Matsil, LLP
- Main IPC: H04R3/00
- IPC: H04R3/00 ; H04R29/00 ; H04R19/04 ; H04R19/00 ; H04R19/01

Abstract:
System and method for detecting a glitch is disclosed. An embodiment comprises increasing a bias voltage of a first capacitor, sampling an input signal of a first plate of the first capacitor with a time period, mixing the input signal with the sampled input signal, and comparing the mixed signal with a reference signal.
Public/Granted literature
- US20150334499A1 Glitch Detection and Method for Detecting a Glitch Public/Granted day:2015-11-19
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