Invention Grant
- Patent Title: Sample imaging apparatus
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Application No.: US12540936Application Date: 2009-08-13
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Publication No.: US09726584B2Publication Date: 2017-08-08
- Inventor: Kazuhiro Yamada
- Applicant: Kazuhiro Yamada
- Applicant Address: JP Kobe-shi
- Assignee: SYSMEX CORPORATION
- Current Assignee: SYSMEX CORPORATION
- Current Assignee Address: JP Kobe-shi
- Agency: Mots Law, PLLC
- Priority: JP2008-244880 20080924
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G01N1/31 ; G01N15/14 ; G01N35/00 ; G06T7/00 ; G01N15/00 ; G01N15/10

Abstract:
A sample imaging apparatus comprising: an imaging section for imaging a stained sample including a stained cell to generate a cell image relating to the stained cell included in the stained sample; and a staining abnormality detector for detecting an abnormality relating to staining of the stained sample on the basis of the cell image generated by the imaging section, is disclosed. A sample imaging apparatus comprising: an imaging section for imaging a stained sample to generate a cell image relating to a cell included in the stained sample; and an imaging abnormality detector for detecting an abnormality relating to the imaging section on the basis of the cell image generated by the imaging section, is also disclosed.
Public/Granted literature
- US20100074506A1 SAMPLE IMAGING APPARATUS Public/Granted day:2010-03-25
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