Invention Grant
- Patent Title: Method of analogue measurement scanning on a machine tool
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Application No.: US14391837Application Date: 2013-04-16
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Publication No.: US09726481B2Publication Date: 2017-08-08
- Inventor: David Roberts McMurtry , John Ould , Tim Prestidge , Iain Ainsworth
- Applicant: RENISHAW PLC
- Applicant Address: GB Wotton-under-Edge
- Assignee: RENISHAW PLC
- Current Assignee: RENISHAW PLC
- Current Assignee Address: GB Wotton-under-Edge
- Agency: Oliff PLC
- Priority: EP12250093 20120418
- International Application: PCT/GB2013/050964 WO 20130416
- International Announcement: WO2013/156765 WO 20131024
- Main IPC: G01B21/04
- IPC: G01B21/04 ; G01B5/008 ; G01B7/008 ; G05B19/401

Abstract:
A method of building up a measurement data set for a surface of an object using an analog measurement probe mounted on a machine tool apparatus which obtains scanned measurement data of the surface over a plurality of offset traverses. Subsequent traverses are offset from previous traverses such that over a series of traverses the analog probe's surface detecting region progresses i) laterally across the object, and/or ii) away from or towards the object. The course of relative motion for at least one subsequent traverse is generated and/or updated based on data obtained during at least one previous traverse.
Public/Granted literature
- US20150121710A1 METHOD OF ANALOGUE MEASUREMENT SCANNING ON A MACHINE TOOL Public/Granted day:2015-05-07
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