Invention Grant
- Patent Title: Capacitor structure and method for manufacturing the same
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Application No.: US15283833Application Date: 2016-10-03
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Publication No.: US09722015B1Publication Date: 2017-08-01
- Inventor: Alexander Kalnitsky , Felix Ying-Kit Tsui
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Current Assignee Address: TW Hsinchu
- Agency: WPAT, P.C., Intellectual Property Attorneys
- Agent Anthony King
- Main IPC: H01L21/8242
- IPC: H01L21/8242 ; H01L49/02 ; H01L21/762

Abstract:
The present disclosure provides a capacitor structure, including a substrate having a conductive region; a trench in the conductive region and having a bottom portion and an inner sidewall portion; a spacer over the inner sidewall portion of the trench; a first conductive layer over the bottom portion and the spacer in the trench; a first dielectric layer over the first conductive layer and in the trench; a second conductive layer over the first dielectric layer and in the trench; and a second dielectric layer over the second conductive layer and in the trench, wherein the spacer comprises an angle in a range of from about 85 to about 89 degrees with respect to the bottom portion of the trench and comprises a flared opening opposite to the bottom portion of the trench. The present disclosure also provides a method for manufacturing the capacitor structure.
Information query
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