Invention Grant
- Patent Title: Laser marking in packages
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Application No.: US15361861Application Date: 2016-11-28
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Publication No.: US09721933B2Publication Date: 2017-08-01
- Inventor: Hsien-Wei Chen
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Slater Matsil, LLP
- Main IPC: H01L21/44
- IPC: H01L21/44 ; H01L25/10 ; H01L25/065 ; H01L25/00 ; H01L23/00 ; H01L23/48 ; H01L23/544 ; H01L23/58 ; H01L21/768 ; H01L23/31

Abstract:
A package includes a device die, a first plurality of redistribution lines underlying the device die, a second plurality of redistribution lines overlying the device die, and a metal pad in a same metal layer as the second plurality of redistribution lines. A laser mark is in a dielectric layer that is overlying the metal pad. The laser mark overlaps the metal pad.
Public/Granted literature
- US20170077075A1 Laser Marking in Packages Public/Granted day:2017-03-16
Information query
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