Invention Grant
- Patent Title: Silicon-germanium fin formation
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Application No.: US15234233Application Date: 2016-08-11
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Publication No.: US09721851B2Publication Date: 2017-08-01
- Inventor: Kangguo Cheng , Pouya Hashemi , Ali Khakifirooz , Alexander Reznicek
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Scott S. Dobson
- Main IPC: H01L21/8234
- IPC: H01L21/8234 ; H01L27/088 ; H01L21/84 ; H01L27/12 ; H01L29/78 ; H01L29/66 ; H01L21/02 ; H01L21/324 ; H01L21/302 ; H01L21/32 ; H01L21/18 ; H01L29/161 ; H01L29/165 ; H01L21/8238

Abstract:
Forming a set of semiconductor fins is disclosed. Forming the set of semiconductor fins can include forming a base structure including a silicon substrate, an insulator layer stacked on the silicon substrate, and a plurality of silicon semiconductor fins each stacked directly on the insulator layer. Forming the set of semiconductor fins can include depositing a first atomic layer of germanium atoms on a first set of semiconductor fins in the plurality of semiconductor fins and annealing the first atomic layer and the first set of semiconductor fins. Forming the set of semiconductor fins can include forming, from the annealing, a first set of silicon-germanium semiconductor fins.
Public/Granted literature
- US20160351454A1 SILICON-GERMANIUM FIN FORMATION Public/Granted day:2016-12-01
Information query
IPC分类: