Invention Grant
- Patent Title: Method of characterizing creped materials
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Application No.: US14370678Application Date: 2013-01-04
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Publication No.: US09721377B2Publication Date: 2017-08-01
- Inventor: Jukka-Pekka Raunio , Mikko Makinen , Henry Skoog
- Applicant: KEMIRA OYJ
- Applicant Address: FI Helsinki
- Assignee: KEMIRA OYJ
- Current Assignee: KEMIRA OYJ
- Current Assignee Address: FI Helsinki
- Agency: Thomas Horstemeyer, LLP
- International Application: PCT/US2013/020304 WO 20130104
- International Announcement: WO2013/103831 WO 20130711
- Main IPC: G06T15/04
- IPC: G06T15/04 ; G01B11/30 ; G01B11/24 ; G01N33/34 ; G06T7/42
Abstract:
Methods of characterizing the topography of a surface of a creped material, devices for characterizing surface topography of a creped material, computer systems for characterizing surface topography of a creped material, and the like, are disclosed.
Public/Granted literature
- US20140347358A1 METHOD OF CHARACTERIZING CREPED MATERIALS Public/Granted day:2014-11-27
Information query
IPC分类:
| G | 物理 |
| G06 | 计算；推算或计数 |
| G06T | 一般的图像数据处理或产生 |
| G06T15/00 | 3D〔三维〕图像的加工 |
| G06T15/04 | .纹理映射 |
